FEI Titan G2 80-200 CREWLEY

The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Tit...

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Main Authors: András Kovács, Roland Schierholz, Karsten Tillmann
Format: Article
Language:English
Published: Forschungszentrum Jülich 2016-02-01
Series:Journal of large-scale research facilities JLSRF
Online Access:http://jlsrf.org/index.php/lsf/article/view/68
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author András Kovács
Roland Schierholz
Karsten Tillmann
author_facet András Kovács
Roland Schierholz
Karsten Tillmann
author_sort András Kovács
collection DOAJ
description The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below.
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spelling doaj.art-a9f34853a5d642ecb5bd3cde61594b602022-12-22T01:08:46ZengForschungszentrum JülichJournal of large-scale research facilities JLSRF2364-091X2016-02-012A4310.17815/jlsrf-2-6860FEI Titan G2 80-200 CREWLEYAndrás KovácsRoland SchierholzKarsten TillmannThe FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below.http://jlsrf.org/index.php/lsf/article/view/68
spellingShingle András Kovács
Roland Schierholz
Karsten Tillmann
FEI Titan G2 80-200 CREWLEY
Journal of large-scale research facilities JLSRF
title FEI Titan G2 80-200 CREWLEY
title_full FEI Titan G2 80-200 CREWLEY
title_fullStr FEI Titan G2 80-200 CREWLEY
title_full_unstemmed FEI Titan G2 80-200 CREWLEY
title_short FEI Titan G2 80-200 CREWLEY
title_sort fei titan g2 80 200 crewley
url http://jlsrf.org/index.php/lsf/article/view/68
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AT rolandschierholz feititang280200crewley
AT karstentillmann feititang280200crewley