Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond

Magnetic imaging with ensembles of nitrogen-vacancy (NV) centres in diamond is a recently developed technique that allows for quantitative vector field mapping. Here we uncover a source of artefacts in the measured magnetic field in situations where the magnetic sample is placed in close proximity (...

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Main Authors: Jean-Philippe Tetienne, David A. Broadway, Scott E. Lillie, Nikolai Dontschuk, Tokuyuki Teraji, Liam T. Hall, Alastair Stacey, David A. Simpson, Lloyd C. L. Hollenberg
Format: Article
Language:English
Published: MDPI AG 2018-04-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/18/4/1290
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author Jean-Philippe Tetienne
David A. Broadway
Scott E. Lillie
Nikolai Dontschuk
Tokuyuki Teraji
Liam T. Hall
Alastair Stacey
David A. Simpson
Lloyd C. L. Hollenberg
author_facet Jean-Philippe Tetienne
David A. Broadway
Scott E. Lillie
Nikolai Dontschuk
Tokuyuki Teraji
Liam T. Hall
Alastair Stacey
David A. Simpson
Lloyd C. L. Hollenberg
author_sort Jean-Philippe Tetienne
collection DOAJ
description Magnetic imaging with ensembles of nitrogen-vacancy (NV) centres in diamond is a recently developed technique that allows for quantitative vector field mapping. Here we uncover a source of artefacts in the measured magnetic field in situations where the magnetic sample is placed in close proximity (a few tens of nm) to the NV sensing layer. Using magnetic nanoparticles as a test sample, we find that the measured field deviates significantly from the calculated field, in shape, amplitude and even in sign. By modelling the full measurement process, we show that these discrepancies are caused by the limited measurement range of NV sensors combined with the finite spatial resolution of the optical readout. We numerically investigate the role of the stand-off distance to identify an artefact-free regime, and discuss an application to ultrathin materials. This work provides a guide to predict and mitigate proximity-induced artefacts that can arise in NV-based wide-field magnetic imaging, and also demonstrates that the sensitivity of these artefacts to the sample can make them a useful tool for magnetic characterisation.
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spelling doaj.art-aae39615f70142babcdf6402484d18d32022-12-22T02:18:48ZengMDPI AGSensors1424-82202018-04-01184129010.3390/s18041290s18041290Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in DiamondJean-Philippe Tetienne0David A. Broadway1Scott E. Lillie2Nikolai Dontschuk3Tokuyuki Teraji4Liam T. Hall5Alastair Stacey6David A. Simpson7Lloyd C. L. Hollenberg8School of Physics, The University of Melbourne, Melbourne 3010, AustraliaSchool of Physics, The University of Melbourne, Melbourne 3010, AustraliaSchool of Physics, The University of Melbourne, Melbourne 3010, AustraliaCentre for Quantum Computation and Communication Technology, School of Physics, The University of Melbourne, Melbourne 3010, AustraliaNational Institute for Materials Science, Tsukuba, Ibaraki 305-0044, JapanSchool of Physics, The University of Melbourne, Melbourne 3010, AustraliaCentre for Quantum Computation and Communication Technology, School of Physics, The University of Melbourne, Melbourne 3010, AustraliaSchool of Physics, The University of Melbourne, Melbourne 3010, AustraliaSchool of Physics, The University of Melbourne, Melbourne 3010, AustraliaMagnetic imaging with ensembles of nitrogen-vacancy (NV) centres in diamond is a recently developed technique that allows for quantitative vector field mapping. Here we uncover a source of artefacts in the measured magnetic field in situations where the magnetic sample is placed in close proximity (a few tens of nm) to the NV sensing layer. Using magnetic nanoparticles as a test sample, we find that the measured field deviates significantly from the calculated field, in shape, amplitude and even in sign. By modelling the full measurement process, we show that these discrepancies are caused by the limited measurement range of NV sensors combined with the finite spatial resolution of the optical readout. We numerically investigate the role of the stand-off distance to identify an artefact-free regime, and discuss an application to ultrathin materials. This work provides a guide to predict and mitigate proximity-induced artefacts that can arise in NV-based wide-field magnetic imaging, and also demonstrates that the sensitivity of these artefacts to the sample can make them a useful tool for magnetic characterisation.http://www.mdpi.com/1424-8220/18/4/1290quantum sensingdiamondnitrogen-vacancy centremagnetic imagingoptically detected magnetic resonance
spellingShingle Jean-Philippe Tetienne
David A. Broadway
Scott E. Lillie
Nikolai Dontschuk
Tokuyuki Teraji
Liam T. Hall
Alastair Stacey
David A. Simpson
Lloyd C. L. Hollenberg
Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
Sensors
quantum sensing
diamond
nitrogen-vacancy centre
magnetic imaging
optically detected magnetic resonance
title Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
title_full Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
title_fullStr Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
title_full_unstemmed Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
title_short Proximity-Induced Artefacts in Magnetic Imaging with Nitrogen-Vacancy Ensembles in Diamond
title_sort proximity induced artefacts in magnetic imaging with nitrogen vacancy ensembles in diamond
topic quantum sensing
diamond
nitrogen-vacancy centre
magnetic imaging
optically detected magnetic resonance
url http://www.mdpi.com/1424-8220/18/4/1290
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