Yun, H., An, C., Jang, H., Cho, K., Lee, J., Eom, S., . . . Baek, R. (2023). Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley.
Chicago Style (17th ed.) CitationYun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
MLA citiranjeYun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
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