Yun, H., An, C., Jang, H., Cho, K., Lee, J., Eom, S., . . . Baek, R. (2023). Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley.
Citação do estilo Chicago (17ª ed.)Yun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
Citação MLA (9ª ed.)Yun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
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