Yun, H., An, C., Jang, H., Cho, K., Lee, J., Eom, S., . . . Baek, R. (2023). Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley.
Chicago Style (17. basım) AtıfYun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
MLA (9th ed.) AtıfYun, Hyeok, et al. Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Wiley, 2023.
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