Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development

Herein, novel neural network (NN) methods that improve prediction accuracy and reduce output variance of the optimized input in the gradient method for cross‐sectional data are proposed, and the variability evaluation approach of optimized inputs in the semiconductor process is suggested. Specifical...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek
स्वरूप: लेख
भाषा:English
प्रकाशित: Wiley 2023-09-01
श्रृंखला:Advanced Intelligent Systems
विषय:
ऑनलाइन पहुंच:https://doi.org/10.1002/aisy.202300089

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