Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography

<p>Abstract</p> <p>We have demonstrated simultaneous fabrication of designed defects within a periodic structure. For rapid fabrication of periodic structures incorporating nanoscale line-defects at large area, topographically assisted holographic lithography (TAHL) technique, comb...

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Main Authors: Kim Ki Seok, Choi Byung-Yeon, Pak Yusin, Lee Kwang-Ho, Jung Gun-Young
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Subjects:
Online Access:http://www.nanoscalereslett.com/content/6/1/449
_version_ 1797718906948812800
author Kim Ki Seok
Choi Byung-Yeon
Pak Yusin
Lee Kwang-Ho
Jung Gun-Young
author_facet Kim Ki Seok
Choi Byung-Yeon
Pak Yusin
Lee Kwang-Ho
Jung Gun-Young
author_sort Kim Ki Seok
collection DOAJ
description <p>Abstract</p> <p>We have demonstrated simultaneous fabrication of designed defects within a periodic structure. For rapid fabrication of periodic structures incorporating nanoscale line-defects at large area, topographically assisted holographic lithography (TAHL) technique, combining the strength of hologram lithography and phase-shift interference, was proposed. Hot-embossing method generated the photoresist patterns with vertical side walls which enabled phase-shift mask effect at the edge of patterns. Embossing temperature and relief height were crucial parameters for the successful TAHL process. Periodic holes with a diameter of 600 nm at a 1 &#956;m-pitch incorporating 250 nm wide line-defects were obtained simultaneously.</p>
first_indexed 2024-03-12T08:57:03Z
format Article
id doaj.art-abb134c32f054ece8dc4d60fffd06c68
institution Directory Open Access Journal
issn 1931-7573
1556-276X
language English
last_indexed 2024-03-12T08:57:03Z
publishDate 2011-01-01
publisher SpringerOpen
record_format Article
series Nanoscale Research Letters
spelling doaj.art-abb134c32f054ece8dc4d60fffd06c682023-09-02T15:57:31ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2011-01-0161449Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithographyKim Ki SeokChoi Byung-YeonPak YusinLee Kwang-HoJung Gun-Young<p>Abstract</p> <p>We have demonstrated simultaneous fabrication of designed defects within a periodic structure. For rapid fabrication of periodic structures incorporating nanoscale line-defects at large area, topographically assisted holographic lithography (TAHL) technique, combining the strength of hologram lithography and phase-shift interference, was proposed. Hot-embossing method generated the photoresist patterns with vertical side walls which enabled phase-shift mask effect at the edge of patterns. Embossing temperature and relief height were crucial parameters for the successful TAHL process. Periodic holes with a diameter of 600 nm at a 1 &#956;m-pitch incorporating 250 nm wide line-defects were obtained simultaneously.</p>http://www.nanoscalereslett.com/content/6/1/449hot-embossingholographic lithographyphase-shift lithographyphotonic crystaldefect generation
spellingShingle Kim Ki Seok
Choi Byung-Yeon
Pak Yusin
Lee Kwang-Ho
Jung Gun-Young
Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
Nanoscale Research Letters
hot-embossing
holographic lithography
phase-shift lithography
photonic crystal
defect generation
title Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
title_full Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
title_fullStr Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
title_full_unstemmed Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
title_short Simultaneous fabrication of line defects-embedded periodic lattice by topographically assisted holographic lithography
title_sort simultaneous fabrication of line defects embedded periodic lattice by topographically assisted holographic lithography
topic hot-embossing
holographic lithography
phase-shift lithography
photonic crystal
defect generation
url http://www.nanoscalereslett.com/content/6/1/449
work_keys_str_mv AT kimkiseok simultaneousfabricationoflinedefectsembeddedperiodiclatticebytopographicallyassistedholographiclithography
AT choibyungyeon simultaneousfabricationoflinedefectsembeddedperiodiclatticebytopographicallyassistedholographiclithography
AT pakyusin simultaneousfabricationoflinedefectsembeddedperiodiclatticebytopographicallyassistedholographiclithography
AT leekwangho simultaneousfabricationoflinedefectsembeddedperiodiclatticebytopographicallyassistedholographiclithography
AT junggunyoung simultaneousfabricationoflinedefectsembeddedperiodiclatticebytopographicallyassistedholographiclithography