A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider
Due to the lack of a standard nanosecond high-voltage pulse generator for sensor calibration, a high-stability nanosecond high-voltage pulse test system was developed in terms of circuit analysis, structural design, and performance test. By establishing the equivalent circuit model of the nanosecond...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-06-01
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| Series: | Energies |
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| Online Access: | https://www.mdpi.com/1996-1073/16/11/4534 |
| _version_ | 1797597592174985216 |
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| author | Jinru Sun Qin Qing Haoliang Liu Xueling Yao Zijiao Jiao Yiheng Wu |
| author_facet | Jinru Sun Qin Qing Haoliang Liu Xueling Yao Zijiao Jiao Yiheng Wu |
| author_sort | Jinru Sun |
| collection | DOAJ |
| description | Due to the lack of a standard nanosecond high-voltage pulse generator for sensor calibration, a high-stability nanosecond high-voltage pulse test system was developed in terms of circuit analysis, structural design, and performance test. By establishing the equivalent circuit model of the nanosecond pulse generator, the circuit component parameters of the five-stage Marx loop and the one-stage compression steepening unit were simulated. The influence of the action performance of the steepening gap on the characteristics of output nanosecond pulse was analyzed. The nanosecond pulse test system was established through the structural design of the nanosecond pulse-generating circuit, the development of a high-performance corona-stabilized switch, and the measurement of a fast-response resistance divider made of metal oxide thin-film resistors. The nanosecond pulse test system has the capability to output a double exponential nanosecond pulse voltages in the amplitude range of 10–60 kV with a rise time of 2.3 ± 0.5 ns and a half-peak time of 23 ± 5 ns. In addition, the output pulse voltage has a high consistency and stability in the full amplitude range. The maximum relative standard deviation of the peak value is 1.517%, and the relative standard uncertainty is less than 5‰. |
| first_indexed | 2024-03-11T03:07:51Z |
| format | Article |
| id | doaj.art-ac1a2aad6cd3446e8c3d83fdcdae7ffd |
| institution | Directory Open Access Journal |
| issn | 1996-1073 |
| language | English |
| last_indexed | 2024-03-11T03:07:51Z |
| publishDate | 2023-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Energies |
| spelling | doaj.art-ac1a2aad6cd3446e8c3d83fdcdae7ffd2023-11-18T07:50:06ZengMDPI AGEnergies1996-10732023-06-011611453410.3390/en16114534A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance DividerJinru Sun0Qin Qing1Haoliang Liu2Xueling Yao3Zijiao Jiao4Yiheng Wu5State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaState Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaState Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaState Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaState Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaState Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, ChinaDue to the lack of a standard nanosecond high-voltage pulse generator for sensor calibration, a high-stability nanosecond high-voltage pulse test system was developed in terms of circuit analysis, structural design, and performance test. By establishing the equivalent circuit model of the nanosecond pulse generator, the circuit component parameters of the five-stage Marx loop and the one-stage compression steepening unit were simulated. The influence of the action performance of the steepening gap on the characteristics of output nanosecond pulse was analyzed. The nanosecond pulse test system was established through the structural design of the nanosecond pulse-generating circuit, the development of a high-performance corona-stabilized switch, and the measurement of a fast-response resistance divider made of metal oxide thin-film resistors. The nanosecond pulse test system has the capability to output a double exponential nanosecond pulse voltages in the amplitude range of 10–60 kV with a rise time of 2.3 ± 0.5 ns and a half-peak time of 23 ± 5 ns. In addition, the output pulse voltage has a high consistency and stability in the full amplitude range. The maximum relative standard deviation of the peak value is 1.517%, and the relative standard uncertainty is less than 5‰.https://www.mdpi.com/1996-1073/16/11/4534nanosecond pulse generatorcircuit simulationresistance dividercalibration methodimproved stability |
| spellingShingle | Jinru Sun Qin Qing Haoliang Liu Xueling Yao Zijiao Jiao Yiheng Wu A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider Energies nanosecond pulse generator circuit simulation resistance divider calibration method improved stability |
| title | A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider |
| title_full | A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider |
| title_fullStr | A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider |
| title_full_unstemmed | A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider |
| title_short | A Compact High-Stability Nanosecond Pulse Test System Using Corona-Stabilized Switch and Coaxial Resistance Divider |
| title_sort | compact high stability nanosecond pulse test system using corona stabilized switch and coaxial resistance divider |
| topic | nanosecond pulse generator circuit simulation resistance divider calibration method improved stability |
| url | https://www.mdpi.com/1996-1073/16/11/4534 |
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