At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals
The advent of next-generation synchrotron radiation sources and X-ray free-electron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Br...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
International Union of Crystallography
2023-11-01
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| Series: | Journal of Synchrotron Radiation |
| Subjects: | |
| Online Access: | http://scripts.iucr.org/cgi-bin/paper?S1600577523007531 |
| _version_ | 1797361741249642496 |
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| author | Xianbo Shi Zhi Qiao Paresh Pradhan Peifan Liu Lahsen Assoufid Kwang-Je Kim Yuri Shvyd'ko |
| author_facet | Xianbo Shi Zhi Qiao Paresh Pradhan Peifan Liu Lahsen Assoufid Kwang-Je Kim Yuri Shvyd'ko |
| author_sort | Xianbo Shi |
| collection | DOAJ |
| description | The advent of next-generation synchrotron radiation sources and X-ray free-electron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray free-electron lasers. |
| first_indexed | 2024-03-08T15:58:47Z |
| format | Article |
| id | doaj.art-ac97e442163346e7a2504c4e6f3d4512 |
| institution | Directory Open Access Journal |
| issn | 1600-5775 |
| language | English |
| last_indexed | 2024-03-08T15:58:47Z |
| publishDate | 2023-11-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj.art-ac97e442163346e7a2504c4e6f3d45122024-01-08T14:37:41ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752023-11-013061100110710.1107/S1600577523007531mo5273At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystalsXianbo Shi0Zhi Qiao1Paresh Pradhan2Peifan Liu3Lahsen Assoufid4Kwang-Je Kim5Yuri Shvyd'ko6Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAArgonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USAThe advent of next-generation synchrotron radiation sources and X-ray free-electron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray free-electron lasers.http://scripts.iucr.org/cgi-bin/paper?S1600577523007531wavefront sensingcrystal diffractioncoded maskphase errorat-wavelength metrology |
| spellingShingle | Xianbo Shi Zhi Qiao Paresh Pradhan Peifan Liu Lahsen Assoufid Kwang-Je Kim Yuri Shvyd'ko At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals Journal of Synchrotron Radiation wavefront sensing crystal diffraction coded mask phase error at-wavelength metrology |
| title | At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals |
| title_full | At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals |
| title_fullStr | At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals |
| title_full_unstemmed | At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals |
| title_short | At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals |
| title_sort | at wavelength characterization of x ray wavefronts in bragg diffraction from crystals |
| topic | wavefront sensing crystal diffraction coded mask phase error at-wavelength metrology |
| url | http://scripts.iucr.org/cgi-bin/paper?S1600577523007531 |
| work_keys_str_mv | AT xianboshi atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT zhiqiao atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT pareshpradhan atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT peifanliu atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT lahsenassoufid atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT kwangjekim atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals AT yurishvydko atwavelengthcharacterizationofxraywavefrontsinbraggdiffractionfromcrystals |