Analysis of Ruggedness of 4H-SiC Power MOSFETs with Various Doping Parameters

This work investigates the effect of the doping concentration of SiC power metal-oxide–semiconductor field-effect transistors (MOSFETs) under an unclamped inductive switching (UIS) condition. Switching circuits such as inverters and motor-drive circuits often face unexpected operating conditions; th...

Full description

Bibliographic Details
Main Authors: Min-Seok Jang, Jee-Hun Jeong, Ho-Jun Lee
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/13/1/427