Generating smooth potential landscapes with thermal scanning-probe lithography
Scanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal sc...
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Format: | Article |
Language: | English |
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IOP Publishing
2023-01-01
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Series: | JPhys Materials |
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Online Access: | https://doi.org/10.1088/2515-7639/ad0f31 |
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author | Nolan Lassaline |
author_facet | Nolan Lassaline |
author_sort | Nolan Lassaline |
collection | DOAJ |
description | Scanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated cantilever to locally sublimate polymer resist, acting as a high-resolution lithography tool and a scanning probe microscope simultaneously. The main advantage of tSPL is the ability to electrically control the temperature and applied force of the tip, which can produce smooth topographical surfaces that are unattainable with conventional nanofabrication techniques. Recent investigations have exploited these surfaces to generate potential landscapes for enhanced control of photons, electrons, excitons, and nanoparticles, demonstrating a broad range of experimental possibilities. This paper outlines the principles, procedures, and limitations of tSPL for generating smooth potentials and discusses the prospective impact in photonics, electronics, and nanomaterials science. |
first_indexed | 2024-03-09T14:02:11Z |
format | Article |
id | doaj.art-ad13271fe18245acbcf7ca97fadd144c |
institution | Directory Open Access Journal |
issn | 2515-7639 |
language | English |
last_indexed | 2024-03-09T14:02:11Z |
publishDate | 2023-01-01 |
publisher | IOP Publishing |
record_format | Article |
series | JPhys Materials |
spelling | doaj.art-ad13271fe18245acbcf7ca97fadd144c2023-11-30T07:26:44ZengIOP PublishingJPhys Materials2515-76392023-01-017101500810.1088/2515-7639/ad0f31Generating smooth potential landscapes with thermal scanning-probe lithographyNolan Lassaline0https://orcid.org/0000-0002-5854-3900Department of Physics, Technical University of Denmark , 2800 Kongens Lyngby, DenmarkScanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated cantilever to locally sublimate polymer resist, acting as a high-resolution lithography tool and a scanning probe microscope simultaneously. The main advantage of tSPL is the ability to electrically control the temperature and applied force of the tip, which can produce smooth topographical surfaces that are unattainable with conventional nanofabrication techniques. Recent investigations have exploited these surfaces to generate potential landscapes for enhanced control of photons, electrons, excitons, and nanoparticles, demonstrating a broad range of experimental possibilities. This paper outlines the principles, procedures, and limitations of tSPL for generating smooth potentials and discusses the prospective impact in photonics, electronics, and nanomaterials science.https://doi.org/10.1088/2515-7639/ad0f31thermal scanning-probe lithographynanophotonicsnanoelectronics2D materialsgrapheneFourier surfaces |
spellingShingle | Nolan Lassaline Generating smooth potential landscapes with thermal scanning-probe lithography JPhys Materials thermal scanning-probe lithography nanophotonics nanoelectronics 2D materials graphene Fourier surfaces |
title | Generating smooth potential landscapes with thermal scanning-probe lithography |
title_full | Generating smooth potential landscapes with thermal scanning-probe lithography |
title_fullStr | Generating smooth potential landscapes with thermal scanning-probe lithography |
title_full_unstemmed | Generating smooth potential landscapes with thermal scanning-probe lithography |
title_short | Generating smooth potential landscapes with thermal scanning-probe lithography |
title_sort | generating smooth potential landscapes with thermal scanning probe lithography |
topic | thermal scanning-probe lithography nanophotonics nanoelectronics 2D materials graphene Fourier surfaces |
url | https://doi.org/10.1088/2515-7639/ad0f31 |
work_keys_str_mv | AT nolanlassaline generatingsmoothpotentiallandscapeswiththermalscanningprobelithography |