Generating smooth potential landscapes with thermal scanning-probe lithography

Scanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal sc...

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Main Author: Nolan Lassaline
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:JPhys Materials
Subjects:
Online Access:https://doi.org/10.1088/2515-7639/ad0f31
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author Nolan Lassaline
author_facet Nolan Lassaline
author_sort Nolan Lassaline
collection DOAJ
description Scanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated cantilever to locally sublimate polymer resist, acting as a high-resolution lithography tool and a scanning probe microscope simultaneously. The main advantage of tSPL is the ability to electrically control the temperature and applied force of the tip, which can produce smooth topographical surfaces that are unattainable with conventional nanofabrication techniques. Recent investigations have exploited these surfaces to generate potential landscapes for enhanced control of photons, electrons, excitons, and nanoparticles, demonstrating a broad range of experimental possibilities. This paper outlines the principles, procedures, and limitations of tSPL for generating smooth potentials and discusses the prospective impact in photonics, electronics, and nanomaterials science.
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spelling doaj.art-ad13271fe18245acbcf7ca97fadd144c2023-11-30T07:26:44ZengIOP PublishingJPhys Materials2515-76392023-01-017101500810.1088/2515-7639/ad0f31Generating smooth potential landscapes with thermal scanning-probe lithographyNolan Lassaline0https://orcid.org/0000-0002-5854-3900Department of Physics, Technical University of Denmark , 2800 Kongens Lyngby, DenmarkScanning probe microscopy (SPM) uses a sharp tip to interrogate surfaces with atomic precision. Inputs such as mechanical, electrical, or thermal energy can activate highly localized interactions, providing a powerful class of instruments for manipulating materials on small length scales. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated cantilever to locally sublimate polymer resist, acting as a high-resolution lithography tool and a scanning probe microscope simultaneously. The main advantage of tSPL is the ability to electrically control the temperature and applied force of the tip, which can produce smooth topographical surfaces that are unattainable with conventional nanofabrication techniques. Recent investigations have exploited these surfaces to generate potential landscapes for enhanced control of photons, electrons, excitons, and nanoparticles, demonstrating a broad range of experimental possibilities. This paper outlines the principles, procedures, and limitations of tSPL for generating smooth potentials and discusses the prospective impact in photonics, electronics, and nanomaterials science.https://doi.org/10.1088/2515-7639/ad0f31thermal scanning-probe lithographynanophotonicsnanoelectronics2D materialsgrapheneFourier surfaces
spellingShingle Nolan Lassaline
Generating smooth potential landscapes with thermal scanning-probe lithography
JPhys Materials
thermal scanning-probe lithography
nanophotonics
nanoelectronics
2D materials
graphene
Fourier surfaces
title Generating smooth potential landscapes with thermal scanning-probe lithography
title_full Generating smooth potential landscapes with thermal scanning-probe lithography
title_fullStr Generating smooth potential landscapes with thermal scanning-probe lithography
title_full_unstemmed Generating smooth potential landscapes with thermal scanning-probe lithography
title_short Generating smooth potential landscapes with thermal scanning-probe lithography
title_sort generating smooth potential landscapes with thermal scanning probe lithography
topic thermal scanning-probe lithography
nanophotonics
nanoelectronics
2D materials
graphene
Fourier surfaces
url https://doi.org/10.1088/2515-7639/ad0f31
work_keys_str_mv AT nolanlassaline generatingsmoothpotentiallandscapeswiththermalscanningprobelithography