Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure

Realizing a tubular conduction channel within a one-dimensional core–shell nanowire (NW) enables better understanding of quantum phenomena and exploration of electronic device applications. Herein, we report the growth of a SiGe(P)/Si core/shell NW heterostructure using a chemical vapor deposition c...

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Main Authors: Xuejing Wang, Yung-Chen Lin, Chia-Tse Tai, Seok Woo Lee, Tzu-Ming Lu, Sun Hae Ra Shin, Sadhvikas J. Addamane, Chris Sheehan, Jiun-Yun Li, Yerim Kim, Jinkyoung Yoo
Format: Article
Language:English
Published: AIP Publishing LLC 2022-11-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0119654
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author Xuejing Wang
Yung-Chen Lin
Chia-Tse Tai
Seok Woo Lee
Tzu-Ming Lu
Sun Hae Ra Shin
Sadhvikas J. Addamane
Chris Sheehan
Jiun-Yun Li
Yerim Kim
Jinkyoung Yoo
author_facet Xuejing Wang
Yung-Chen Lin
Chia-Tse Tai
Seok Woo Lee
Tzu-Ming Lu
Sun Hae Ra Shin
Sadhvikas J. Addamane
Chris Sheehan
Jiun-Yun Li
Yerim Kim
Jinkyoung Yoo
author_sort Xuejing Wang
collection DOAJ
description Realizing a tubular conduction channel within a one-dimensional core–shell nanowire (NW) enables better understanding of quantum phenomena and exploration of electronic device applications. Herein, we report the growth of a SiGe(P)/Si core/shell NW heterostructure using a chemical vapor deposition coupled with vapor–liquid–solid growth mechanism. The entire NW heterostructure behaves as a p-type semiconductor, which demonstrates that the high-density carriers are confined within the 4 nm-thick Si shell and form a tubular conduction channel. These findings are confirmed by both calculations and the gate-dependent current–voltage (Id–Vg) characteristics. Atomic resolution microscopic analyses suggest a coherent epitaxial core/shell interface where strain is released by forming dislocations along the axial direction of the NW heterostructure. Additional surface passivation achieved via growing a SiGe(P)/Si/SiGe core/multishell NW heterostructure suggests potential strategies to enhance the tubular carrier density, which could be further modified by improving multishell crystallinity and structural design.
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spelling doaj.art-ad8c45cce7ab47de825cb508b9a195ff2023-01-19T16:28:28ZengAIP Publishing LLCAPL Materials2166-532X2022-11-011011111108111108-710.1063/5.0119654Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructureXuejing Wang0Yung-Chen Lin1Chia-Tse Tai2Seok Woo Lee3Tzu-Ming Lu4Sun Hae Ra Shin5Sadhvikas J. Addamane6Chris Sheehan7Jiun-Yun Li8Yerim Kim9Jinkyoung Yoo10Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USACenter for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USAGraduate Institute of Electronics Engineering, National Taiwan University, Taipei 10617, TaiwanSchool of Electrical and Electronic Engineering, Nanyang Technological University, 639798, SingaporeCenter for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, USACenter for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USACenter for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87123, USACenter for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USAGraduate Institute of Electronics Engineering, National Taiwan University, Taipei 10617, TaiwanCenter for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USACenter for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USARealizing a tubular conduction channel within a one-dimensional core–shell nanowire (NW) enables better understanding of quantum phenomena and exploration of electronic device applications. Herein, we report the growth of a SiGe(P)/Si core/shell NW heterostructure using a chemical vapor deposition coupled with vapor–liquid–solid growth mechanism. The entire NW heterostructure behaves as a p-type semiconductor, which demonstrates that the high-density carriers are confined within the 4 nm-thick Si shell and form a tubular conduction channel. These findings are confirmed by both calculations and the gate-dependent current–voltage (Id–Vg) characteristics. Atomic resolution microscopic analyses suggest a coherent epitaxial core/shell interface where strain is released by forming dislocations along the axial direction of the NW heterostructure. Additional surface passivation achieved via growing a SiGe(P)/Si/SiGe core/multishell NW heterostructure suggests potential strategies to enhance the tubular carrier density, which could be further modified by improving multishell crystallinity and structural design.http://dx.doi.org/10.1063/5.0119654
spellingShingle Xuejing Wang
Yung-Chen Lin
Chia-Tse Tai
Seok Woo Lee
Tzu-Ming Lu
Sun Hae Ra Shin
Sadhvikas J. Addamane
Chris Sheehan
Jiun-Yun Li
Yerim Kim
Jinkyoung Yoo
Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
APL Materials
title Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
title_full Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
title_fullStr Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
title_full_unstemmed Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
title_short Formation of tubular conduction channel in a SiGe(P)/Si core/shell nanowire heterostructure
title_sort formation of tubular conduction channel in a sige p si core shell nanowire heterostructure
url http://dx.doi.org/10.1063/5.0119654
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