Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The column...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2016-11-01
|
| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.7.167 |
| _version_ | 1828850308134993920 |
|---|---|
| author | Volodymyr Tkachenko Antigone Marino Eva Otón Noureddine Bennis Josè Manuel Otón |
| author_facet | Volodymyr Tkachenko Antigone Marino Eva Otón Noureddine Bennis Josè Manuel Otón |
| author_sort | Volodymyr Tkachenko |
| collection | DOAJ |
| description | Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The columnar SiO2 structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated for large deposition angles. |
| first_indexed | 2024-12-12T23:09:09Z |
| format | Article |
| id | doaj.art-adb50c0a549e4c8aa7e37d5f2b485b5f |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-12T23:09:09Z |
| publishDate | 2016-11-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-adb50c0a549e4c8aa7e37d5f2b485b5f2022-12-22T00:08:37ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862016-11-01711743174810.3762/bjnano.7.1672190-4286-7-167Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropyVolodymyr Tkachenko0Antigone Marino1Eva Otón2Noureddine Bennis3Josè Manuel Otón4CNR-ISASI and Physics Department, University of Naples Federico II, Via Cinthia Monte S. Angelo, 80126, Naples, ItalyCNR-ISASI and Physics Department, University of Naples Federico II, Via Cinthia Monte S. Angelo, 80126, Naples, ItalyCEMDATIC, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid, Avda. Complutense 30, 28040 Madrid, Spain,Institute of Applied Physics, Military University of Technology, 00-908 Warsaw, PolandCEMDATIC, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid, Avda. Complutense 30, 28040 Madrid, Spain,Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The columnar SiO2 structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated for large deposition angles.https://doi.org/10.3762/bjnano.7.167anisotropyellipsometryliquid crystal alignmentmorphologythin film |
| spellingShingle | Volodymyr Tkachenko Antigone Marino Eva Otón Noureddine Bennis Josè Manuel Otón Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy Beilstein Journal of Nanotechnology anisotropy ellipsometry liquid crystal alignment morphology thin film |
| title | Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| title_full | Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| title_fullStr | Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| title_full_unstemmed | Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| title_short | Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| title_sort | morphology of sio2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy |
| topic | anisotropy ellipsometry liquid crystal alignment morphology thin film |
| url | https://doi.org/10.3762/bjnano.7.167 |
| work_keys_str_mv | AT volodymyrtkachenko morphologyofsio2filmsasakeyfactorinalignmentofliquidcrystalswithnegativedielectricanisotropy AT antigonemarino morphologyofsio2filmsasakeyfactorinalignmentofliquidcrystalswithnegativedielectricanisotropy AT evaoton morphologyofsio2filmsasakeyfactorinalignmentofliquidcrystalswithnegativedielectricanisotropy AT noureddinebennis morphologyofsio2filmsasakeyfactorinalignmentofliquidcrystalswithnegativedielectricanisotropy AT josemanueloton morphologyofsio2filmsasakeyfactorinalignmentofliquidcrystalswithnegativedielectricanisotropy |