Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The column...

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Bibliographic Details
Main Authors: Volodymyr Tkachenko, Antigone Marino, Eva Otón, Noureddine Bennis, Josè Manuel Otón
Format: Article
Language:English
Published: Beilstein-Institut 2016-11-01
Series:Beilstein Journal of Nanotechnology
Subjects:
anisotropy
ellipsometry
liquid crystal alignment
morphology
thin film
Online Access:https://doi.org/10.3762/bjnano.7.167

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