Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applica...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-08-01
|
| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/20/17/4784 |
| _version_ | 1827707759081029632 |
|---|---|
| author | Bernard Ouma Alunda Yong Joong Lee |
| author_facet | Bernard Ouma Alunda Yong Joong Lee |
| author_sort | Bernard Ouma Alunda |
| collection | DOAJ |
| description | This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review. |
| first_indexed | 2024-03-10T16:53:12Z |
| format | Article |
| id | doaj.art-ae321db7185a4048bb488f581fa2ffd4 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T16:53:12Z |
| publishDate | 2020-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-ae321db7185a4048bb488f581fa2ffd42023-11-20T11:14:34ZengMDPI AGSensors1424-82202020-08-012017478410.3390/s20174784Review: Cantilever-Based Sensors for High Speed Atomic Force MicroscopyBernard Ouma Alunda0Yong Joong Lee1School of Mines and Engineering, Taita Taveta University, P.O. Box 635-80300 Voi, KenyaSchool of Mechanical Engineering, Kyungpook National University, Daegu 41566, KoreaThis review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.https://www.mdpi.com/1424-8220/20/17/4784microcantileveratomic force microscopeultra-short cantilevershigh-speed atomic force microscopebiosensors |
| spellingShingle | Bernard Ouma Alunda Yong Joong Lee Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy Sensors microcantilever atomic force microscope ultra-short cantilevers high-speed atomic force microscope biosensors |
| title | Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy |
| title_full | Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy |
| title_fullStr | Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy |
| title_full_unstemmed | Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy |
| title_short | Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy |
| title_sort | review cantilever based sensors for high speed atomic force microscopy |
| topic | microcantilever atomic force microscope ultra-short cantilevers high-speed atomic force microscope biosensors |
| url | https://www.mdpi.com/1424-8220/20/17/4784 |
| work_keys_str_mv | AT bernardoumaalunda reviewcantileverbasedsensorsforhighspeedatomicforcemicroscopy AT yongjoonglee reviewcantileverbasedsensorsforhighspeedatomicforcemicroscopy |