Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology
The fabrication of nanostructures with high resolution and precise control of the deposition site makes Focused Electron Beam Induced Deposition (FEBID) a unique nanolithography process. In the case of magnetic materials, apart from the FEBID potential in standard substrates for multiple application...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-10-01
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| Series: | Magnetochemistry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2312-7481/7/10/140 |
| _version_ | 1797514057500065792 |
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| author | Javier Pablo-Navarro Soraya Sangiao César Magén José María de Teresa |
| author_facet | Javier Pablo-Navarro Soraya Sangiao César Magén José María de Teresa |
| author_sort | Javier Pablo-Navarro |
| collection | DOAJ |
| description | The fabrication of nanostructures with high resolution and precise control of the deposition site makes Focused Electron Beam Induced Deposition (FEBID) a unique nanolithography process. In the case of magnetic materials, apart from the FEBID potential in standard substrates for multiple applications in data storage and logic, the use of this technology for the growth of nanomagnets on different types of scanning probes opens new paths in magnetic sensing, becoming a benchmark for magnetic functionalization. This work reviews the recent advances in the integration of FEBID magnetic nanostructures onto cantilevers to produce advanced magnetic sensing devices with unprecedented performance. |
| first_indexed | 2024-03-10T06:26:14Z |
| format | Article |
| id | doaj.art-ae681a830dd2446f86b3883d797484d2 |
| institution | Directory Open Access Journal |
| issn | 2312-7481 |
| language | English |
| last_indexed | 2024-03-10T06:26:14Z |
| publishDate | 2021-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Magnetochemistry |
| spelling | doaj.art-ae681a830dd2446f86b3883d797484d22023-11-22T18:54:48ZengMDPI AGMagnetochemistry2312-74812021-10-0171014010.3390/magnetochemistry7100140Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition TechnologyJavier Pablo-Navarro0Soraya Sangiao1César Magén2José María de Teresa3Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, GermanyInstituto de Nanociencia y Materiales de Aragón (INMA), Universidad de Zaragoza-CSIC, 50009 Zaragoza, SpainInstituto de Nanociencia y Materiales de Aragón (INMA), Universidad de Zaragoza-CSIC, 50009 Zaragoza, SpainInstituto de Nanociencia y Materiales de Aragón (INMA), Universidad de Zaragoza-CSIC, 50009 Zaragoza, SpainThe fabrication of nanostructures with high resolution and precise control of the deposition site makes Focused Electron Beam Induced Deposition (FEBID) a unique nanolithography process. In the case of magnetic materials, apart from the FEBID potential in standard substrates for multiple applications in data storage and logic, the use of this technology for the growth of nanomagnets on different types of scanning probes opens new paths in magnetic sensing, becoming a benchmark for magnetic functionalization. This work reviews the recent advances in the integration of FEBID magnetic nanostructures onto cantilevers to produce advanced magnetic sensing devices with unprecedented performance.https://www.mdpi.com/2312-7481/7/10/140nanomagnetismfocused electron beam induced depositionnanofabricationnanolithographymagnetic nanowiresthree-dimensional |
| spellingShingle | Javier Pablo-Navarro Soraya Sangiao César Magén José María de Teresa Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology Magnetochemistry nanomagnetism focused electron beam induced deposition nanofabrication nanolithography magnetic nanowires three-dimensional |
| title | Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology |
| title_full | Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology |
| title_fullStr | Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology |
| title_full_unstemmed | Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology |
| title_short | Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology |
| title_sort | magnetic functionalization of scanning probes by focused electron beam induced deposition technology |
| topic | nanomagnetism focused electron beam induced deposition nanofabrication nanolithography magnetic nanowires three-dimensional |
| url | https://www.mdpi.com/2312-7481/7/10/140 |
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