HIGH FREQUENCY OHMIC LOSSES IN TERAHERTZ FREQUENCY RANGE CW CLINOTRONS
Reliable simulations of electron-vacuum devices’ opera-tion parameters are an actual challenge during the R&D process. One of the most important problems is determining high frequency ohmic losses and taking them into account in the simulation. The surface roughness investigation of the clinotro...
Main Authors: | Yu. S. Kovshov, S. S. Ponomarenko, S. A. Kishko, S. A. Vlasenko, A. A. Lihachev, V. V. Zavertanniy, E. M. Khutoryan, A. N. Kuleshov |
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Format: | Article |
Language: | English |
Published: |
Akademperiodyka
2017-03-01
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Series: | Радиофизика и электроника |
Subjects: | |
Online Access: | http://re-journal.org.ua/sites/default/files/file_attach/arh_fulltxt/11.pdf |
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