Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench]
Sorghum is an important cereal crop, cultivated both in kharif and rabi seasons. Especially rabi sorghum is known for their grain quality and used exclusively for human consumption. The present study was undertaken to induce variability through physical and chemical mutagens for morphological and...
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Format: | Article |
Language: | English |
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Indian Society of Plant Breeders
2022-06-01
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Series: | Electronic Journal of Plant Breeding |
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Online Access: | https://www.ejplantbreeding.org/index.php/EJPB/article/view/3954 |
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author | S. M. Surashe1, H. V. Kalpande1, Ashok Badignnavar2, Ambika More1* and T. R. Ganapathi2 |
author_facet | S. M. Surashe1, H. V. Kalpande1, Ashok Badignnavar2, Ambika More1* and T. R. Ganapathi2 |
author_sort | S. M. Surashe1, H. V. Kalpande1, Ashok Badignnavar2, Ambika More1* and T. R. Ganapathi2 |
collection | DOAJ |
description | Sorghum is an important cereal crop, cultivated both in kharif and rabi seasons. Especially rabi sorghum is known for
their grain quality and used exclusively for human consumption. The present study was undertaken to induce variability
through physical and chemical mutagens for morphological and yield-contributing traits. A popular rabi sorghum
variety, Parbhani Moti was initially irradiated with gamma rays (100-400 Gy), ethyl methane sulphonate (0.1- 0.4%
EMS) and their combinations. Based on the univariate analysis, mutants with early flowering (63 days), mid tall (90
cm) and long panicles (21 cm) were identified across various mutagenic treatments in M2 generation. Gamma ray and
EMS combined treatment showed the highest grain yield (85 g/plant) with high SPAD values compared to parent. High
heritability value of 74.6 per cent was observed for grain yield with genetic advance and ranged from 1.22 to 19.96
per cent across different treatments. Significant positive correlation between SPAD values and grain yield and panicle
length were observed. Cluster analysis based on Euclidean distance grouped all the mutants into four clusters with
those derived from gamma rays (400 Gy) emerging as highly diverse. Promising mutants identified in this study would
serve as genetic resources for recombination breeding. |
first_indexed | 2024-04-09T19:34:49Z |
format | Article |
id | doaj.art-ae8dc779bb984052b06d436b17ca7e74 |
institution | Directory Open Access Journal |
issn | 0975-928X |
language | English |
last_indexed | 2024-04-09T19:34:49Z |
publishDate | 2022-06-01 |
publisher | Indian Society of Plant Breeders |
record_format | Article |
series | Electronic Journal of Plant Breeding |
spelling | doaj.art-ae8dc779bb984052b06d436b17ca7e742023-04-04T16:16:41ZengIndian Society of Plant BreedersElectronic Journal of Plant Breeding0975-928X2022-06-0113231231810.37992/2022.1302.053Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench]S. M. Surashe1, H. V. Kalpande1, Ashok Badignnavar2, Ambika More1* and T. R. Ganapathi201Department of Agricultural Botany, Vasantrao Naik Marathwada Krishi Vidyapeeth, Parbhani, Maharashtra, India 2Nuclear Agriculture and Biotechnology Division, Bhabha Atomic Research Centre (BARC), Mumbai, India *E-Mail: ambikamore@rediffmail.comSorghum is an important cereal crop, cultivated both in kharif and rabi seasons. Especially rabi sorghum is known for their grain quality and used exclusively for human consumption. The present study was undertaken to induce variability through physical and chemical mutagens for morphological and yield-contributing traits. A popular rabi sorghum variety, Parbhani Moti was initially irradiated with gamma rays (100-400 Gy), ethyl methane sulphonate (0.1- 0.4% EMS) and their combinations. Based on the univariate analysis, mutants with early flowering (63 days), mid tall (90 cm) and long panicles (21 cm) were identified across various mutagenic treatments in M2 generation. Gamma ray and EMS combined treatment showed the highest grain yield (85 g/plant) with high SPAD values compared to parent. High heritability value of 74.6 per cent was observed for grain yield with genetic advance and ranged from 1.22 to 19.96 per cent across different treatments. Significant positive correlation between SPAD values and grain yield and panicle length were observed. Cluster analysis based on Euclidean distance grouped all the mutants into four clusters with those derived from gamma rays (400 Gy) emerging as highly diverse. Promising mutants identified in this study would serve as genetic resources for recombination breeding.https://www.ejplantbreeding.org/index.php/EJPB/article/view/3954emsgrain yieldgamma raysgenetic variabilityinduced mutations |
spellingShingle | S. M. Surashe1, H. V. Kalpande1, Ashok Badignnavar2, Ambika More1* and T. R. Ganapathi2 Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] Electronic Journal of Plant Breeding ems grain yield gamma rays genetic variability induced mutations |
title | Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] |
title_full | Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] |
title_fullStr | Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] |
title_full_unstemmed | Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] |
title_short | Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench] |
title_sort | mutation induced phenotypic variation for yield traits in sorghum sorghum bicolor l moench |
topic | ems grain yield gamma rays genetic variability induced mutations |
url | https://www.ejplantbreeding.org/index.php/EJPB/article/view/3954 |
work_keys_str_mv | AT smsurashe1hvkalpande1ashokbadignnavar2ambikamore1andtrganapathi2 mutationinducedphenotypicvariationforyieldtraitsinsorghumsorghumbicolorlmoench |