Sequential Detection of Image Defects for Patterned Fabrics
Automatic fabric defect detection has been successfully applied to establish the quality quick response system for the automation of textile production. However, the image complexity and diversity of patterned fabrics have effects on the fabric defect detection, which makes it difficult for automati...
Main Authors: | Wenzhen Wang, Na Deng, Binjie Xin |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9199891/ |
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