Two-Stage Deep Anomaly Detection With Heterogeneous Time Series Data
We introduce a data-driven anomaly detection framework using a manufacturing dataset collected from a factory assembly line. Given <italic>heterogeneous</italic> time series data consisting of operation cycle signals and sensor signals, we aim at discovering abnormal events. Motivated by...
Main Authors: | Kyeong-Joong Jeong, Jin-Duk Park, Kyusoon Hwang, Seong-Lyun Kim, Won-Yong Shin |
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Format: | Article |
Language: | English |
Published: |
IEEE
2022-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9695481/ |
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