Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area
Based on the test site at the Qinghai�Tibet Plateau with an altitude of 4 300 m, atmospheric neutron single event effects of a 65 nm high�speed large�area static random access memory (SRAM) array were measured in real�time. By breaking through key technologies such as effect screening, intelligent r...
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| Format: | Article |
| Language: | English |
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Editorial Board of Atomic Energy Science and Technology
2022-04-01
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| Series: | Yuanzineng kexue jishu |
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| Online Access: | https://www.aest.org.cn/CN/10.7538/yzk.2021.youxian.0307 |
| _version_ | 1798015724583649280 |
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| author | ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang |
| author_facet | ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang |
| author_sort | ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang |
| collection | DOAJ |
| description | Based on the test site at the Qinghai�Tibet Plateau with an altitude of 4 300 m, atmospheric neutron single event effects of a 65 nm high�speed large�area static random access memory (SRAM) array were measured in real�time. By breaking through key technologies such as effect screening, intelligent remote measurement and control, a total of 39 single�event upset were observed during the 153 d test period, of which multiple�cell upset (MCU) accounts for 23%, and the largest MCU is 9 bits. The contribution ratios of high�energy neutron, thermal neutron and alpha particle were analyzed in detail, and based on the multi�ground neutron flux data, the single�bit upset (SBU) and MCU failure in time (FIT) at Beijing ground and 10 km high�altitude application were deduced. It is found that the main cause of soft error on the ground is the alpha particle. As the altitude increases, the contribution of atmospheric neutron to soft error increases significantly. All MCUs are caused by high�energy neutron, and the MCU FIT value at an altitude of 10 km in Beijing is obviously increased. Its proportion increases from 8% of the ground to 26%. In combination with the device layout, an in�depth analysis of the MCU generation mechanism was carried out. Finally, a goal�oriented optimization method of memory soft error hardening strategy was proposed. |
| first_indexed | 2024-04-11T15:38:26Z |
| format | Article |
| id | doaj.art-af8d2b0d3cec40b7adc4f4eb2639bf25 |
| institution | Directory Open Access Journal |
| issn | 1000-6931 |
| language | English |
| last_indexed | 2024-04-11T15:38:26Z |
| publishDate | 2022-04-01 |
| publisher | Editorial Board of Atomic Energy Science and Technology |
| record_format | Article |
| series | Yuanzineng kexue jishu |
| spelling | doaj.art-af8d2b0d3cec40b7adc4f4eb2639bf252022-12-22T04:15:53ZengEditorial Board of Atomic Energy Science and TechnologyYuanzineng kexue jishu1000-69312022-04-01564725733Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude AreaZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang 0China Electronic Product Reliability and Environmental Testing Research Institute, Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, Guangzhou 511370, China;Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaBased on the test site at the Qinghai�Tibet Plateau with an altitude of 4 300 m, atmospheric neutron single event effects of a 65 nm high�speed large�area static random access memory (SRAM) array were measured in real�time. By breaking through key technologies such as effect screening, intelligent remote measurement and control, a total of 39 single�event upset were observed during the 153 d test period, of which multiple�cell upset (MCU) accounts for 23%, and the largest MCU is 9 bits. The contribution ratios of high�energy neutron, thermal neutron and alpha particle were analyzed in detail, and based on the multi�ground neutron flux data, the single�bit upset (SBU) and MCU failure in time (FIT) at Beijing ground and 10 km high�altitude application were deduced. It is found that the main cause of soft error on the ground is the alpha particle. As the altitude increases, the contribution of atmospheric neutron to soft error increases significantly. All MCUs are caused by high�energy neutron, and the MCU FIT value at an altitude of 10 km in Beijing is obviously increased. Its proportion increases from 8% of the ground to 26%. In combination with the device layout, an in�depth analysis of the MCU generation mechanism was carried out. Finally, a goal�oriented optimization method of memory soft error hardening strategy was proposed.https://www.aest.org.cn/CN/10.7538/yzk.2021.youxian.0307atmospheric neutronsingle event effecthigh-altitudesoft error rate |
| spellingShingle | ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area Yuanzineng kexue jishu atmospheric neutron single event effect high-altitude soft error rate |
| title | Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area |
| title_full | Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area |
| title_fullStr | Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area |
| title_full_unstemmed | Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area |
| title_short | Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area |
| title_sort | experimental study on real time measurement of atmospheric neutron induced single event effect based on high altitude area |
| topic | atmospheric neutron single event effect high-altitude soft error rate |
| url | https://www.aest.org.cn/CN/10.7538/yzk.2021.youxian.0307 |
| work_keys_str_mv | AT zhangzhangangleizhifenghuangyunenyunfeizhangyitongtenglixiaohuishiqianpengchaoheyujuanxiaoqingzhonglijiankeluguoguang experimentalstudyonrealtimemeasurementofatmosphericneutroninducedsingleeventeffectbasedonhighaltitudearea |