Measuring the Pull-Off Force of an Individual Fiber Using a Novel Picoindenter/Scanning Electron Microscope Technique

Measuring the Pull-Off Force of an Individual Fiber Using a Novel Picoindenter/Scanning Electron Microscope Technique

We employed a novel picoindenter (PI)/scanning electron microscopy (SEM) technique to measure the pull-off force of an individual electrospun poly(vinylidene fluoride) (PVDF) fibers. Individual fibers were deposited over a channel in a custom-designed silicon substrate, which was then attached to a...

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Bibliographic Details
Main Authors: Rahul Sahay, Ihor Radchenko, Arief S. Budiman, Avinash Baji
Format: Article
Language:English
Published: MDPI AG 2017-09-01
Series:Materials
Subjects:
picoindenter
SEM
pull-off force
mechanical properties
electrospinning
Online Access:https://www.mdpi.com/1996-1944/10/9/1074

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