X- ray diffraction and dielectric properties of PbSe thin films
Lead selenide PbSe thin films of different thicknesses (300, 500, and 700 nm) were deposited under vacuum using thermal evaporation method on glass substrates. X-ray diffraction measurements showed that increasing of thickness lead to well crystallize the prepared samples, such that the crystallite...
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| Format: | Article |
| Language: | English |
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University of Baghdad
2019-01-01
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| Series: | Iraqi Journal of Physics |
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| Online Access: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/115 |
| _version_ | 1797871392388022272 |
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| author | Bushra A. Hasan |
| author_facet | Bushra A. Hasan |
| author_sort | Bushra A. Hasan |
| collection | DOAJ |
| description |
Lead selenide PbSe thin films of different thicknesses (300, 500, and 700 nm) were deposited under vacuum using thermal evaporation method on glass substrates. X-ray diffraction measurements showed that increasing of thickness lead to well crystallize the prepared samples, such that the crystallite size increases while the dislocation density decreases with thickness increasing. A.C conductivity, dielectric constants, and loss tangent are studied as function to thickness, frequency (10kHz-10MHz) and temperatures (293K-493K). The conductivity measurements confirm confirmed that hopping is the mechanism responsible for the conduction process. Increasing of thickness decreases the thermal activation energy estimated from Arhinus equation is found to decrease with thickness increasing. The increase of thickness lead to reduce the polarizability α while the increasing of temperature lead to increase α.
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| first_indexed | 2024-04-10T00:42:07Z |
| format | Article |
| id | doaj.art-afe6718d0d4c43f5bad88f109b66f53f |
| institution | Directory Open Access Journal |
| issn | 2070-4003 2664-5548 |
| language | English |
| last_indexed | 2024-04-10T00:42:07Z |
| publishDate | 2019-01-01 |
| publisher | University of Baghdad |
| record_format | Article |
| series | Iraqi Journal of Physics |
| spelling | doaj.art-afe6718d0d4c43f5bad88f109b66f53f2023-03-14T05:37:11ZengUniversity of BaghdadIraqi Journal of Physics2070-40032664-55482019-01-01153410.30723/ijp.v15i34.115X- ray diffraction and dielectric properties of PbSe thin filmsBushra A. Hasan Lead selenide PbSe thin films of different thicknesses (300, 500, and 700 nm) were deposited under vacuum using thermal evaporation method on glass substrates. X-ray diffraction measurements showed that increasing of thickness lead to well crystallize the prepared samples, such that the crystallite size increases while the dislocation density decreases with thickness increasing. A.C conductivity, dielectric constants, and loss tangent are studied as function to thickness, frequency (10kHz-10MHz) and temperatures (293K-493K). The conductivity measurements confirm confirmed that hopping is the mechanism responsible for the conduction process. Increasing of thickness decreases the thermal activation energy estimated from Arhinus equation is found to decrease with thickness increasing. The increase of thickness lead to reduce the polarizability α while the increasing of temperature lead to increase α. https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/115PbSe, vacuum deposition, conduction studies, thin films, dielectric relaxation, complex capacitance. |
| spellingShingle | Bushra A. Hasan X- ray diffraction and dielectric properties of PbSe thin films Iraqi Journal of Physics PbSe, vacuum deposition, conduction studies, thin films, dielectric relaxation, complex capacitance. |
| title | X- ray diffraction and dielectric properties of PbSe thin films |
| title_full | X- ray diffraction and dielectric properties of PbSe thin films |
| title_fullStr | X- ray diffraction and dielectric properties of PbSe thin films |
| title_full_unstemmed | X- ray diffraction and dielectric properties of PbSe thin films |
| title_short | X- ray diffraction and dielectric properties of PbSe thin films |
| title_sort | x ray diffraction and dielectric properties of pbse thin films |
| topic | PbSe, vacuum deposition, conduction studies, thin films, dielectric relaxation, complex capacitance. |
| url | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/115 |
| work_keys_str_mv | AT bushraahasan xraydiffractionanddielectricpropertiesofpbsethinfilms |