KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved]
The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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F1000 Research Ltd
2023-01-01
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| Series: | Open Research Europe |
| Subjects: | |
| Online Access: | https://open-research-europe.ec.europa.eu/articles/1-95/v2 |
| _version_ | 1797961299431260160 |
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| author | Alberto Mittiga Marco Montecchi Francesca Menchini Claudia Malerba |
| author_facet | Alberto Mittiga Marco Montecchi Francesca Menchini Claudia Malerba |
| author_sort | Alberto Mittiga |
| collection | DOAJ |
| description | The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software. In the case of complex multilayer devices, generally a number of simpler specimens (like single-film on substrate) must be preliminarily characterized. This paper introduces the reader to a new open source software for thin film characterization finally released after about 30 years of development. The software has already been used in various fields of physics, such as thin film optical filters, architectural glazing, detectors for high energy physics, solar energy, and, last but not least, photovoltaic devices. Code source files, MS Windows executable, user manual as well as a sample of working directories populated with assorted files can be freely downloaded from the kSEMAW GitHub repository. |
| first_indexed | 2024-04-11T00:57:57Z |
| format | Article |
| id | doaj.art-aff11ad035b34c5bb87b1e2783bb12b5 |
| institution | Directory Open Access Journal |
| issn | 2732-5121 |
| language | English |
| last_indexed | 2024-04-11T00:57:57Z |
| publishDate | 2023-01-01 |
| publisher | F1000 Research Ltd |
| record_format | Article |
| series | Open Research Europe |
| spelling | doaj.art-aff11ad035b34c5bb87b1e2783bb12b52023-01-05T01:00:00ZengF1000 Research LtdOpen Research Europe2732-51212023-01-01116693KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved]Alberto Mittiga0https://orcid.org/0000-0001-8148-2707Marco Montecchi1https://orcid.org/0000-0002-6942-8078Francesca Menchini2Claudia Malerba3https://orcid.org/0000-0001-6976-3442Energy Technologies and Renewable Sources Department, ENEA Research Center Casaccia, Roma, 00123, ItalyEnergy Technologies and Renewable Sources Department, ENEA Research Center Casaccia, Roma, 00123, ItalyEnergy Technologies and Renewable Sources Department, ENEA Research Center Casaccia, Roma, 00123, ItalyEnergy Technologies and Renewable Sources Department, ENEA Research Center Casaccia, Roma, 00123, ItalyThe optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software. In the case of complex multilayer devices, generally a number of simpler specimens (like single-film on substrate) must be preliminarily characterized. This paper introduces the reader to a new open source software for thin film characterization finally released after about 30 years of development. The software has already been used in various fields of physics, such as thin film optical filters, architectural glazing, detectors for high energy physics, solar energy, and, last but not least, photovoltaic devices. Code source files, MS Windows executable, user manual as well as a sample of working directories populated with assorted files can be freely downloaded from the kSEMAW GitHub repository.https://open-research-europe.ec.europa.eu/articles/1-95/v2thin film optical characterization complex refractive index film thickness spectrophotometric measurements ellipsometric measurementseng |
| spellingShingle | Alberto Mittiga Marco Montecchi Francesca Menchini Claudia Malerba KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] Open Research Europe thin film optical characterization complex refractive index film thickness spectrophotometric measurements ellipsometric measurements eng |
| title | KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] |
| title_full | KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] |
| title_fullStr | KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] |
| title_full_unstemmed | KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] |
| title_short | KSEMAW: an open source software for the analysis of spectrophotometric, ellipsometric and photothermal deflection spectroscopy measurements [version 2; peer review: 2 approved] |
| title_sort | ksemaw an open source software for the analysis of spectrophotometric ellipsometric and photothermal deflection spectroscopy measurements version 2 peer review 2 approved |
| topic | thin film optical characterization complex refractive index film thickness spectrophotometric measurements ellipsometric measurements eng |
| url | https://open-research-europe.ec.europa.eu/articles/1-95/v2 |
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