PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction

Patent analysis is a field that concerns the analysis of patent records, for the purpose of extracting insights and trends, and it is widely used in various fields. Despite the abundance of proprietary software employed for this purpose, there is currently a lack of easy-to-use and publicly availabl...

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Bibliographic Details
Main Authors: Konstantinos Petrakis, Konstantinos Georgiou, Nikolaos Mittas, Lefteris Angelis
Format: Article
Language:English
Published: MDPI AG 2023-12-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/13/24/13147
Description
Summary:Patent analysis is a field that concerns the analysis of patent records, for the purpose of extracting insights and trends, and it is widely used in various fields. Despite the abundance of proprietary software employed for this purpose, there is currently a lack of easy-to-use and publicly available software that can offer simple and intuitive visualizations, while advocating for open science and scientific software development. In this study, we attempt to fill this gap by offering PatentInspector, an open-source, public tool that, by leveraging patent data from the United States Trademark and Patent Office, is able to produce descriptive analytics, thematic axes and citation network analysis. The use and interpretability of PatentInspector is illustrated through a use case on human resource management-related patents, highlighting its functionalities. The results indicate that PatentInspector is a practical resource for conducting patent analytics and can be used by individuals with a limited or no background in coding and software development.
ISSN:2076-3417