PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction
Patent analysis is a field that concerns the analysis of patent records, for the purpose of extracting insights and trends, and it is widely used in various fields. Despite the abundance of proprietary software employed for this purpose, there is currently a lack of easy-to-use and publicly availabl...
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Format: | Article |
Language: | English |
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MDPI AG
2023-12-01
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Series: | Applied Sciences |
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Online Access: | https://www.mdpi.com/2076-3417/13/24/13147 |
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author | Konstantinos Petrakis Konstantinos Georgiou Nikolaos Mittas Lefteris Angelis |
author_facet | Konstantinos Petrakis Konstantinos Georgiou Nikolaos Mittas Lefteris Angelis |
author_sort | Konstantinos Petrakis |
collection | DOAJ |
description | Patent analysis is a field that concerns the analysis of patent records, for the purpose of extracting insights and trends, and it is widely used in various fields. Despite the abundance of proprietary software employed for this purpose, there is currently a lack of easy-to-use and publicly available software that can offer simple and intuitive visualizations, while advocating for open science and scientific software development. In this study, we attempt to fill this gap by offering PatentInspector, an open-source, public tool that, by leveraging patent data from the United States Trademark and Patent Office, is able to produce descriptive analytics, thematic axes and citation network analysis. The use and interpretability of PatentInspector is illustrated through a use case on human resource management-related patents, highlighting its functionalities. The results indicate that PatentInspector is a practical resource for conducting patent analytics and can be used by individuals with a limited or no background in coding and software development. |
first_indexed | 2024-03-08T21:01:53Z |
format | Article |
id | doaj.art-b06dd821d8964a65ac9de156bc8b8f2e |
institution | Directory Open Access Journal |
issn | 2076-3417 |
language | English |
last_indexed | 2024-03-08T21:01:53Z |
publishDate | 2023-12-01 |
publisher | MDPI AG |
record_format | Article |
series | Applied Sciences |
spelling | doaj.art-b06dd821d8964a65ac9de156bc8b8f2e2023-12-22T13:51:38ZengMDPI AGApplied Sciences2076-34172023-12-0113241314710.3390/app132413147PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information ExtractionKonstantinos Petrakis0Konstantinos Georgiou1Nikolaos Mittas2Lefteris Angelis3School of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, GreeceSchool of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, GreeceDepartment of Chemistry, International Hellenic University, 65404 Kavala, GreeceSchool of Informatics, Aristotle University of Thessaloniki, 54124 Thessaloniki, GreecePatent analysis is a field that concerns the analysis of patent records, for the purpose of extracting insights and trends, and it is widely used in various fields. Despite the abundance of proprietary software employed for this purpose, there is currently a lack of easy-to-use and publicly available software that can offer simple and intuitive visualizations, while advocating for open science and scientific software development. In this study, we attempt to fill this gap by offering PatentInspector, an open-source, public tool that, by leveraging patent data from the United States Trademark and Patent Office, is able to produce descriptive analytics, thematic axes and citation network analysis. The use and interpretability of PatentInspector is illustrated through a use case on human resource management-related patents, highlighting its functionalities. The results indicate that PatentInspector is a practical resource for conducting patent analytics and can be used by individuals with a limited or no background in coding and software development.https://www.mdpi.com/2076-3417/13/24/13147patent analyticsscientific software developmenttopic modelingcitation networks |
spellingShingle | Konstantinos Petrakis Konstantinos Georgiou Nikolaos Mittas Lefteris Angelis PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction Applied Sciences patent analytics scientific software development topic modeling citation networks |
title | PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction |
title_full | PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction |
title_fullStr | PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction |
title_full_unstemmed | PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction |
title_short | PatentInspector: An Open-Source Tool for Applied Patent Analysis and Information Extraction |
title_sort | patentinspector an open source tool for applied patent analysis and information extraction |
topic | patent analytics scientific software development topic modeling citation networks |
url | https://www.mdpi.com/2076-3417/13/24/13147 |
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