A Survey of Methods and Tools for Test Program Generation for Microprocessors
This paper gives a survey of existing methods and tools for test program generation for microprocessors. Test program generation and analysis of their execution traces is the main approach to functional verification of microprocessors. This approach is also known as testing. Despite continuous progr...
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| Format: | Article |
| Language: | English |
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Ivannikov Institute for System Programming of the Russian Academy of Sciences
2018-10-01
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| Series: | Труды Института системного программирования РАН |
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| Online Access: | https://ispranproceedings.elpub.ru/jour/article/view/239 |
| _version_ | 1818792034917416960 |
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| author | A. D. Tatarnikov |
| author_facet | A. D. Tatarnikov |
| author_sort | A. D. Tatarnikov |
| collection | DOAJ |
| description | This paper gives a survey of existing methods and tools for test program generation for microprocessors. Test program generation and analysis of their execution traces is the main approach to functional verification of microprocessors. This approach is also known as testing. Despite continuous progress in test program generation methods, testing remains an extremely laborious process. One of the main reasons is that test program generation tools are unable to quickly enough adapt to changes. In the majority of cases, they are created for specific microprocessor types and are designed to solve specific tasks. For this reason, support for new microprocessors types and generation methods requires a significant effort. Often, in such situations, tools have to be implemented from scratch. Inability to reuse existing implementations of generation methods complicates evolution of test generation tools and, consequently, prevents improvement of testing quality. The present situation creates motivation to search for solutions to developing more flexible tools which could be easily adapted to testing new microprocessor types and applying new generation methods. The goal of the present work is to summarize existing experience in test program generation, which could serve as a basis for creating such tools. The paper considers strengths and weaknesses of popular generation methods, their application domains and cases of their combined use. It also makes a comparative analysis of facilities of existing generation tools implementing these methods. Based on the analysis, it gives recommendations on creating a unified methodology to develop tools for test program generation for microprocessors. |
| first_indexed | 2024-12-18T15:20:50Z |
| format | Article |
| id | doaj.art-b0afd7ada78b46eb95c9839e54b6089c |
| institution | Directory Open Access Journal |
| issn | 2079-8156 2220-6426 |
| language | English |
| last_indexed | 2024-12-18T15:20:50Z |
| publishDate | 2018-10-01 |
| publisher | Ivannikov Institute for System Programming of the Russian Academy of Sciences |
| record_format | Article |
| series | Труды Института системного программирования РАН |
| spelling | doaj.art-b0afd7ada78b46eb95c9839e54b6089c2022-12-21T21:03:24ZengIvannikov Institute for System Programming of the Russian Academy of SciencesТруды Института системного программирования РАН2079-81562220-64262018-10-0129116719410.15514/ISPRAS-2017-29(1)-11239A Survey of Methods and Tools for Test Program Generation for MicroprocessorsA. D. Tatarnikov0Институт системного программирования РАНThis paper gives a survey of existing methods and tools for test program generation for microprocessors. Test program generation and analysis of their execution traces is the main approach to functional verification of microprocessors. This approach is also known as testing. Despite continuous progress in test program generation methods, testing remains an extremely laborious process. One of the main reasons is that test program generation tools are unable to quickly enough adapt to changes. In the majority of cases, they are created for specific microprocessor types and are designed to solve specific tasks. For this reason, support for new microprocessors types and generation methods requires a significant effort. Often, in such situations, tools have to be implemented from scratch. Inability to reuse existing implementations of generation methods complicates evolution of test generation tools and, consequently, prevents improvement of testing quality. The present situation creates motivation to search for solutions to developing more flexible tools which could be easily adapted to testing new microprocessor types and applying new generation methods. The goal of the present work is to summarize existing experience in test program generation, which could serve as a basis for creating such tools. The paper considers strengths and weaknesses of popular generation methods, their application domains and cases of their combined use. It also makes a comparative analysis of facilities of existing generation tools implementing these methods. Based on the analysis, it gives recommendations on creating a unified methodology to develop tools for test program generation for microprocessors.https://ispranproceedings.elpub.ru/jour/article/view/239микропроцессорыцифровая аппаратурафункциональная верификациятестированиегенерация тестовых программ |
| spellingShingle | A. D. Tatarnikov A Survey of Methods and Tools for Test Program Generation for Microprocessors Труды Института системного программирования РАН микропроцессоры цифровая аппаратура функциональная верификация тестирование генерация тестовых программ |
| title | A Survey of Methods and Tools for Test Program Generation for Microprocessors |
| title_full | A Survey of Methods and Tools for Test Program Generation for Microprocessors |
| title_fullStr | A Survey of Methods and Tools for Test Program Generation for Microprocessors |
| title_full_unstemmed | A Survey of Methods and Tools for Test Program Generation for Microprocessors |
| title_short | A Survey of Methods and Tools for Test Program Generation for Microprocessors |
| title_sort | survey of methods and tools for test program generation for microprocessors |
| topic | микропроцессоры цифровая аппаратура функциональная верификация тестирование генерация тестовых программ |
| url | https://ispranproceedings.elpub.ru/jour/article/view/239 |
| work_keys_str_mv | AT adtatarnikov asurveyofmethodsandtoolsfortestprogramgenerationformicroprocessors AT adtatarnikov surveyofmethodsandtoolsfortestprogramgenerationformicroprocessors |