The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer
Differential distribution profiles of the thermal «junction-to-case» resistance of KP723G transistors in accordance with the attachment of the crystals into the package have been investigated. Spectra of thermal resistances were calculated from the analysis of the temporal dependence of the dynamic...
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| Format: | Article |
| Language: | English |
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Politehperiodika
2012-10-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| Subjects: | |
| Online Access: | http://www.tkea.com.ua/tkea/2012/5_2012/pdf/10.zip |
| _version_ | 1818365722574716928 |
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| author | Turtsevich А. S. Rubtsevich I. I. Solov’yov Ya. А. Vas’kov O. S. Kononenko V. К. Niss V. S. Kerentsev А. F. |
| author_facet | Turtsevich А. S. Rubtsevich I. I. Solov’yov Ya. А. Vas’kov O. S. Kononenko V. К. Niss V. S. Kerentsev А. F. |
| author_sort | Turtsevich А. S. |
| collection | DOAJ |
| description | Differential distribution profiles of the thermal «junction-to-case» resistance of KP723G transistors in accordance with the attachment of the crystals into the package have been investigated. Spectra of thermal resistances were calculated from the analysis of the temporal dependence of the dynamic thermal impedance obtained by a new non-destructive method of differential spectroscopy. The dependence of internal thermal resistance of transistor structure components on the thermal relaxation time constant is presented. |
| first_indexed | 2024-12-13T22:24:47Z |
| format | Article |
| id | doaj.art-b14573f8acc84c0c9f3f1fa8aded2fa6 |
| institution | Directory Open Access Journal |
| issn | 2225-5818 |
| language | English |
| last_indexed | 2024-12-13T22:24:47Z |
| publishDate | 2012-10-01 |
| publisher | Politehperiodika |
| record_format | Article |
| series | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| spelling | doaj.art-b14573f8acc84c0c9f3f1fa8aded2fa62022-12-21T23:29:15ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182012-10-0154447The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometerTurtsevich А. S.Rubtsevich I. I.Solov’yov Ya. А.Vas’kov O. S.Kononenko V. К.Niss V. S.Kerentsev А. F.Differential distribution profiles of the thermal «junction-to-case» resistance of KP723G transistors in accordance with the attachment of the crystals into the package have been investigated. Spectra of thermal resistances were calculated from the analysis of the temporal dependence of the dynamic thermal impedance obtained by a new non-destructive method of differential spectroscopy. The dependence of internal thermal resistance of transistor structure components on the thermal relaxation time constant is presented.http://www.tkea.com.ua/tkea/2012/5_2012/pdf/10.ziptransistorthermal resistancetransient impedance-spectrometercrystal attachment |
| spellingShingle | Turtsevich А. S. Rubtsevich I. I. Solov’yov Ya. А. Vas’kov O. S. Kononenko V. К. Niss V. S. Kerentsev А. F. The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer Tekhnologiya i Konstruirovanie v Elektronnoi Apparature transistor thermal resistance transient impedance-spectrometer crystal attachment |
| title | The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer |
| title_full | The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer |
| title_fullStr | The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer |
| title_full_unstemmed | The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer |
| title_short | The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer |
| title_sort | investigation of quality of power transistor crystals soldering by a transient impedance spectrometer |
| topic | transistor thermal resistance transient impedance-spectrometer crystal attachment |
| url | http://www.tkea.com.ua/tkea/2012/5_2012/pdf/10.zip |
| work_keys_str_mv | AT turtsevichas theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT rubtsevichii theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT solovyovyaa theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT vaskovos theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT kononenkovk theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT nissvs theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT kerentsevaf theinvestigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT turtsevichas investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT rubtsevichii investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT solovyovyaa investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT vaskovos investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT kononenkovk investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT nissvs investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer AT kerentsevaf investigationofqualityofpowertransistorcrystalssolderingbyatransientimpedancespectrometer |