Extending Developer Experience Metrics for Better Effort-Aware Just-In-Time Defect Prediction
Developers use defect prediction models to efficiently allocate limited resources for quality assurance and appropriately make a plan for software quality improvement activities. Traditionally, defect predictions are conducted at the module level, such as the class or file level. However, a more rec...
Main Authors: | Yeongjun Cho, Jung-Hyun Kwon, Jooyong Yi, In-Young Ko |
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Format: | Article |
Language: | English |
Published: |
IEEE
2022-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9973237/ |
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