EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of...
| Main Authors: | , |
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| Format: | Article |
| Language: | Russian |
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Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/148 |
| _version_ | 1826547617933295616 |
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| author | A. I. Belous A. V. Prybylski |
| author_facet | A. I. Belous A. V. Prybylski |
| author_sort | A. I. Belous |
| collection | DOAJ |
| description | With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits. |
| first_indexed | 2024-04-10T03:16:50Z |
| format | Article |
| id | doaj.art-b299a5a0f544435aba3e708af82d6236 |
| institution | Directory Open Access Journal |
| issn | 1729-7648 |
| language | Russian |
| last_indexed | 2025-03-14T05:52:30Z |
| publishDate | 2019-06-01 |
| publisher | Educational institution «Belarusian State University of Informatics and Radioelectronics» |
| record_format | Article |
| series | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| spelling | doaj.art-b299a5a0f544435aba3e708af82d62362025-03-05T12:42:59ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482019-06-01019496147EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATIONA. I. Belous0A. V. Prybylski1ОАО «ИНТЕГРАЛ»Белорусский государственный университет информатики и радиоэлектроникиWith increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.https://doklady.bsuir.by/jour/article/view/148дефектотказнадежностьпробой диэлектрика |
| spellingShingle | A. I. Belous A. V. Prybylski EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki дефект отказ надежность пробой диэлектрика |
| title | EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION |
| title_full | EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION |
| title_fullStr | EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION |
| title_full_unstemmed | EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION |
| title_short | EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION |
| title_sort | effective method of unreliable cmos circuts identification |
| topic | дефект отказ надежность пробой диэлектрика |
| url | https://doklady.bsuir.by/jour/article/view/148 |
| work_keys_str_mv | AT aibelous effectivemethodofunreliablecmoscircutsidentification AT avprybylski effectivemethodofunreliablecmoscircutsidentification |