TOPOLOGICAL LOCALISATION OF DEFECTS AT ATOMIC SCALE

TOPOLOGICAL LOCALISATION OF DEFECTS AT ATOMIC SCALE

The problem addressed in this paper is the detection of defects on atomic structures. The procedure proposed is in two steps. At first a tessellation is built starting from the atoms. It consists of a partition of the space into cells, and is used to define the neighbourhood relationships between th...

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Bibliographic Details
Main Authors: Jean-Paul Jernot, Patricia Jouannot-Chesney, Christian Lantuéjoul, Gérard Nouet, Pierre Ruterana
Format: Article
Language:English
Published: Slovenian Society for Stereology and Quantitative Image Analysis 2011-05-01
Series:Image Analysis and Stereology
Subjects:
defects
Euler-Poincare characteristic
HREM images
interfaces
tessellations
topology
Online Access:http://www.ias-iss.org/ojs/IAS/article/view/713

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