Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides

Experimental studies of transport in GaPN dilute nitrides have evidenced low hole mobilities, which limit their applications in optoelectronics. Theoretical work to date has not explained the origin of such low hole mobilities. Here, we use full band cellular Monte Carlo methods to investigate hole...

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Main Authors: Yongjie Zou, Stephen M. Goodnick
Format: Article
Language:English
Published: AIP Publishing LLC 2021-03-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0043001
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author Yongjie Zou
Stephen M. Goodnick
author_facet Yongjie Zou
Stephen M. Goodnick
author_sort Yongjie Zou
collection DOAJ
description Experimental studies of transport in GaPN dilute nitrides have evidenced low hole mobilities, which limit their applications in optoelectronics. Theoretical work to date has not explained the origin of such low hole mobilities. Here, we use full band cellular Monte Carlo methods to investigate hole transport in C-doped GaPN dilute nitrides as a function of hole concentration. Good agreement between simulation and experiment is obtained by introducing a doping-dependent self-compensation. The results suggest that the reduction in the hole mobility is caused by the compensation for the p-type C doping, which is likely due to the formation of C–N complexes that act as donor scattering centers. This agrees well with the low C activation ratio reported by Liu et al. [Appl. Phys. Lett. 96, 032106 (2010)] and other studies on C–N complexes in GaP.
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spelling doaj.art-b2d58bb7f73a4717ab6c4b731be7f6012022-12-21T19:04:23ZengAIP Publishing LLCAIP Advances2158-32262021-03-01113035207035207-410.1063/5.0043001Compensation effects on hole transport in C-doped p-type GaPN dilute nitridesYongjie Zou0Stephen M. Goodnick1School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85281, USASchool of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85281, USAExperimental studies of transport in GaPN dilute nitrides have evidenced low hole mobilities, which limit their applications in optoelectronics. Theoretical work to date has not explained the origin of such low hole mobilities. Here, we use full band cellular Monte Carlo methods to investigate hole transport in C-doped GaPN dilute nitrides as a function of hole concentration. Good agreement between simulation and experiment is obtained by introducing a doping-dependent self-compensation. The results suggest that the reduction in the hole mobility is caused by the compensation for the p-type C doping, which is likely due to the formation of C–N complexes that act as donor scattering centers. This agrees well with the low C activation ratio reported by Liu et al. [Appl. Phys. Lett. 96, 032106 (2010)] and other studies on C–N complexes in GaP.http://dx.doi.org/10.1063/5.0043001
spellingShingle Yongjie Zou
Stephen M. Goodnick
Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
AIP Advances
title Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
title_full Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
title_fullStr Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
title_full_unstemmed Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
title_short Compensation effects on hole transport in C-doped p-type GaPN dilute nitrides
title_sort compensation effects on hole transport in c doped p type gapn dilute nitrides
url http://dx.doi.org/10.1063/5.0043001
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