High-resolution spectral information enables phenotyping of leaf epicuticular wax in wheat

High-resolution spectral information enables phenotyping of leaf epicuticular wax in wheat

Abstract Background Epicuticular wax (EW) is the first line of defense in plants for protection against biotic and abiotic factors in the environment. In wheat, EW is associated with resilience to heat and drought stress, however, the current limitations on phenotyping EW restrict the integration of...

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Bibliographic Details
Main Authors: Fátima Camarillo-Castillo, Trevis D. Huggins, Suchismita Mondal, Matthew P. Reynolds, Michael Tilley, Dirk B. Hays
Format: Article
Language:English
Published: BMC 2021-06-01
Series:Plant Methods
Subjects:
Plant cuticle
Vegetation indices
High-throughput phenotyping
Wheat breeding
Online Access:https://doi.org/10.1186/s13007-021-00759-w

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