Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy
Thickness and surface profiling of transparent/semi-transparent specimens are vital in various applications, including electronics, optics, healthcare, and biotechnology. Surface profiling techniques characterize and analyze surface thickness, morphology, and roughness. Developing easy-to-use, singl...
| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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Elsevier
2023-12-01
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| Series: | Applied Surface Science Advances |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2666523923001186 |
| _version_ | 1797389432103370752 |
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| author | Subhash Utadiya Vismay Trivedi Kevin Bhanderi Mugdha Joglekar Chaitanya Limberkar Kireet Patel Gyanendra Sheoran Humberto Cabrera Bahram Javidi Arun Anand |
| author_facet | Subhash Utadiya Vismay Trivedi Kevin Bhanderi Mugdha Joglekar Chaitanya Limberkar Kireet Patel Gyanendra Sheoran Humberto Cabrera Bahram Javidi Arun Anand |
| author_sort | Subhash Utadiya |
| collection | DOAJ |
| description | Thickness and surface profiling of transparent/semi-transparent specimens are vital in various applications, including electronics, optics, healthcare, and biotechnology. Surface profiling techniques characterize and analyze surface thickness, morphology, and roughness. Developing easy-to-use, single-shot, wide field-of-view techniques that provide nanometer level surface thickness and profiling is vital for these applications. Digital holography is a state-of-the-art technique that provides the quantitative phase images of transparent objects, from which their thickness profiles could be extracted and used for surface profiling. It has the added advantage of numerical focusing. The present manuscript details the development of a compact wide field of view, self-referencing, lens-less digital holographic microscope for surface profiling of transparent/semi-transparent samples in transmission and reflection mode. The developed microscope requires only a glass plate to generate holograms and can be used to study the dynamics of the surfaces also. It provides a field of view of 3.2mm x 2.5 mm along with a thickness measurement resolution of 2.8 nm and temporal stability of 1.1 nm over a period of 120 s. The developed microscope was tested by measuring the thickness of GeSe semiconductor thin films grown on glass substrates and comparing it with AFM measurements. The microscope was then used to quantify spatially varying thickness profiles of overlapped thin films, junction formed by heterogenous compounds and metal thin films. The microscope was also tested for dynamic studies of surface profiles by thermally loading ink markings on glass slides. |
| first_indexed | 2024-03-08T22:55:52Z |
| format | Article |
| id | doaj.art-b2ff31a3b2284c34bfa0ebb86157ccd5 |
| institution | Directory Open Access Journal |
| issn | 2666-5239 |
| language | English |
| last_indexed | 2024-03-08T22:55:52Z |
| publishDate | 2023-12-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Applied Surface Science Advances |
| spelling | doaj.art-b2ff31a3b2284c34bfa0ebb86157ccd52023-12-16T06:09:26ZengElsevierApplied Surface Science Advances2666-52392023-12-0118100484Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopySubhash Utadiya0Vismay Trivedi1Kevin Bhanderi2Mugdha Joglekar3Chaitanya Limberkar4Kireet Patel5Gyanendra Sheoran6Humberto Cabrera7Bahram Javidi8Arun Anand9Applied Physics Department, Faculty of Technology and Engineering, The Maharaja Sayajirao University of Baroda, Vadodara 390001, IndiaDepartment of Applied Sciences, National Institute of Technology Delhi, IndiaOptics Laboratory, Department of Physics, Sardar Patel University, Vallabh Vidyanagar, Anand 388120, IndiaApplied Physics Department, Faculty of Technology and Engineering, The Maharaja Sayajirao University of Baroda, Vadodara 390001, IndiaOptics Laboratory, Department of Physics, Sardar Patel University, Vallabh Vidyanagar, Anand 388120, IndiaOptics Laboratory, Department of Physics, Sardar Patel University, Vallabh Vidyanagar, Anand 388120, IndiaDepartment of Applied Sciences, National Institute of Technology Delhi, IndiaMLAB, STI Unit, The Abdus Salam International Centre for Theoretical Physics, Strada Costiera 11, 34151 Trieste, ItalyElectrical and Computer Engineering Department, University of Connecticut, Storrs 06269-4157, USAOptics Laboratory, Department of Physics, Sardar Patel University, Vallabh Vidyanagar, Anand 388120, India; Corresponding author.Thickness and surface profiling of transparent/semi-transparent specimens are vital in various applications, including electronics, optics, healthcare, and biotechnology. Surface profiling techniques characterize and analyze surface thickness, morphology, and roughness. Developing easy-to-use, single-shot, wide field-of-view techniques that provide nanometer level surface thickness and profiling is vital for these applications. Digital holography is a state-of-the-art technique that provides the quantitative phase images of transparent objects, from which their thickness profiles could be extracted and used for surface profiling. It has the added advantage of numerical focusing. The present manuscript details the development of a compact wide field of view, self-referencing, lens-less digital holographic microscope for surface profiling of transparent/semi-transparent samples in transmission and reflection mode. The developed microscope requires only a glass plate to generate holograms and can be used to study the dynamics of the surfaces also. It provides a field of view of 3.2mm x 2.5 mm along with a thickness measurement resolution of 2.8 nm and temporal stability of 1.1 nm over a period of 120 s. The developed microscope was tested by measuring the thickness of GeSe semiconductor thin films grown on glass substrates and comparing it with AFM measurements. The microscope was then used to quantify spatially varying thickness profiles of overlapped thin films, junction formed by heterogenous compounds and metal thin films. The microscope was also tested for dynamic studies of surface profiles by thermally loading ink markings on glass slides.http://www.sciencedirect.com/science/article/pii/S2666523923001186Digital holographic microscopyQuantitative phase imagingSurface profileOptical thickness |
| spellingShingle | Subhash Utadiya Vismay Trivedi Kevin Bhanderi Mugdha Joglekar Chaitanya Limberkar Kireet Patel Gyanendra Sheoran Humberto Cabrera Bahram Javidi Arun Anand Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy Applied Surface Science Advances Digital holographic microscopy Quantitative phase imaging Surface profile Optical thickness |
| title | Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy |
| title_full | Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy |
| title_fullStr | Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy |
| title_full_unstemmed | Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy |
| title_short | Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy |
| title_sort | thickness and surface profiling of optically transparent and reflecting samples using lens less self referencing digital holographic microscopy |
| topic | Digital holographic microscopy Quantitative phase imaging Surface profile Optical thickness |
| url | http://www.sciencedirect.com/science/article/pii/S2666523923001186 |
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