Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model
A novel method of generating multi-frequency test stimuli for incipient faults is presented to improve the fault detection accuracy of analog circuits. This paper analyzes the primary cause of low incipient fault detection accuracy and indicates that the high aliasing between the incipient fault res...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8392683/ |