| Summary: | High-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from an S-band photoinjector, where scattered electrons, after interacting with a sample, are collected and imaged by a quadrupole imaging system. We achieve a spatial resolution of a few microns (∼4 μm) and a thickness resolution of a few percent for a silicon target of 300–600 μm in thickness. With additional dark-field images captured by selecting electrons with large scattering angles, we show that complementary information for determining external details such as outlines, boundaries and defects can be obtained.
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