Experiments on bright-field and dark-field high-energy electron imaging with thick target material
High-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from a...
Main Authors: | , , , , , , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
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American Physical Society
2018-07-01
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Series: | Physical Review Accelerators and Beams |
Online Access: | http://doi.org/10.1103/PhysRevAccelBeams.21.074701 |
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author | Zheng Zhou Yingchao Du Shuchun Cao Zimin Zhang Wenhui Huang Huaibi Chen Rui Cheng Zhijun Chi Ming Liu Xiaolu Su Chuanxiang Tang Qili Tian Wei Wang Yanru Wang Jiahao Xiao Lixin Yan Quantang Zhao Yunliang Zhu Youwei Zhou Yang Zong Wei Gai |
author_facet | Zheng Zhou Yingchao Du Shuchun Cao Zimin Zhang Wenhui Huang Huaibi Chen Rui Cheng Zhijun Chi Ming Liu Xiaolu Su Chuanxiang Tang Qili Tian Wei Wang Yanru Wang Jiahao Xiao Lixin Yan Quantang Zhao Yunliang Zhu Youwei Zhou Yang Zong Wei Gai |
author_sort | Zheng Zhou |
collection | DOAJ |
description | High-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from an S-band photoinjector, where scattered electrons, after interacting with a sample, are collected and imaged by a quadrupole imaging system. We achieve a spatial resolution of a few microns (∼4 μm) and a thickness resolution of a few percent for a silicon target of 300–600 μm in thickness. With additional dark-field images captured by selecting electrons with large scattering angles, we show that complementary information for determining external details such as outlines, boundaries and defects can be obtained. |
first_indexed | 2024-12-21T12:22:43Z |
format | Article |
id | doaj.art-b48b94b989084a59a7d86f6ecb76480f |
institution | Directory Open Access Journal |
issn | 2469-9888 |
language | English |
last_indexed | 2024-12-21T12:22:43Z |
publishDate | 2018-07-01 |
publisher | American Physical Society |
record_format | Article |
series | Physical Review Accelerators and Beams |
spelling | doaj.art-b48b94b989084a59a7d86f6ecb76480f2022-12-21T19:04:16ZengAmerican Physical SocietyPhysical Review Accelerators and Beams2469-98882018-07-0121707470110.1103/PhysRevAccelBeams.21.074701Experiments on bright-field and dark-field high-energy electron imaging with thick target materialZheng ZhouYingchao DuShuchun CaoZimin ZhangWenhui HuangHuaibi ChenRui ChengZhijun ChiMing LiuXiaolu SuChuanxiang TangQili TianWei WangYanru WangJiahao XiaoLixin YanQuantang ZhaoYunliang ZhuYouwei ZhouYang ZongWei GaiHigh-energy charged particle radiography has been used for diagnostics of high-energy density matter, and electrons can serve as a promising radiographic probe that acts as a complement to commonly used proton probes. Here we report on an electron radiography experiment using 45 MeV electrons from an S-band photoinjector, where scattered electrons, after interacting with a sample, are collected and imaged by a quadrupole imaging system. We achieve a spatial resolution of a few microns (∼4 μm) and a thickness resolution of a few percent for a silicon target of 300–600 μm in thickness. With additional dark-field images captured by selecting electrons with large scattering angles, we show that complementary information for determining external details such as outlines, boundaries and defects can be obtained.http://doi.org/10.1103/PhysRevAccelBeams.21.074701 |
spellingShingle | Zheng Zhou Yingchao Du Shuchun Cao Zimin Zhang Wenhui Huang Huaibi Chen Rui Cheng Zhijun Chi Ming Liu Xiaolu Su Chuanxiang Tang Qili Tian Wei Wang Yanru Wang Jiahao Xiao Lixin Yan Quantang Zhao Yunliang Zhu Youwei Zhou Yang Zong Wei Gai Experiments on bright-field and dark-field high-energy electron imaging with thick target material Physical Review Accelerators and Beams |
title | Experiments on bright-field and dark-field high-energy electron imaging with thick target material |
title_full | Experiments on bright-field and dark-field high-energy electron imaging with thick target material |
title_fullStr | Experiments on bright-field and dark-field high-energy electron imaging with thick target material |
title_full_unstemmed | Experiments on bright-field and dark-field high-energy electron imaging with thick target material |
title_short | Experiments on bright-field and dark-field high-energy electron imaging with thick target material |
title_sort | experiments on bright field and dark field high energy electron imaging with thick target material |
url | http://doi.org/10.1103/PhysRevAccelBeams.21.074701 |
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