Thermal Infrared Spectrometer for Earth Science Remote Sensing Applications—Instrument Modifications and Measurement Procedures

Thermal Infrared Spectrometer for Earth Science Remote Sensing Applications—Instrument Modifications and Measurement Procedures

In this article we describe a new instrumental setup at the University of Twente Faculty ITC with an optimized processing chain to measure absolute directional-hemispherical reflectance values of typical earth science samples in the 2.5 to 16 µm range. A Bruker Vertex 70 FTIR spectrometer was chosen...

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Bibliographic Details
Main Authors:	Freek van der Meer, Boudewijn de Smeth, Frank van Ruitenbeek, Henk Wilbrink, Harald van der Werff, Simon Hook, Mark van der Meijde, Wim Bakker, Christoph Hecker
Format:	Article
Language:	English
Published:	MDPI AG 2011-11-01
Series:	Sensors
Subjects:	vibrational spectroscopy thermal infrared Fourier transform infrared spectroscopy directional hemispherical reflectance earth science remote sensing
Online Access:	http://www.mdpi.com/1424-8220/11/11/10981/

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