| Summary: | In this paper we introduce a practical method to evaluate the reflectance of a layered turbid medium with a thin layer, which is not possible with the previous methods based on the diffusion theory. To this end, we employ two different reflectance models simultaneously. One is the newly improved 2-flux model for a thin layer and the other is the diffusion model for a thick layer. To combine the evaluation results from these two different models, we introduce a re-parameterization approach which makes these models compatible with each other. We verify that the proposed method yields robust performance by comparing with the Monte Carlo simulation. We also validate visual results and comparing the rendering time ours with other models.
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