CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE
The article describes the calibration method of the photometric system for a particular purpose of estimation position of the conductor connecting the semiconductor chip and the substrate. A nonlinear model of the camera lens distortion, which allows estimating the position of the conductor in a thr...
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| Format: | Article |
| Language: | Russian |
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Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
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| Online Access: | https://doklady.bsuir.by/jour/article/view/229 |
| _version_ | 1826547618955657216 |
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| author | I. N. Gubchik |
| author_facet | I. N. Gubchik |
| author_sort | I. N. Gubchik |
| collection | DOAJ |
| description | The article describes the calibration method of the photometric system for a particular purpose of estimation position of the conductor connecting the semiconductor chip and the substrate. A nonlinear model of the camera lens distortion, which allows estimating the position of the conductor in a three-dimensional space with the required accuracy is described. The novelty of the described technique is to provide the required accuracy of conductor parameters measurement with a high processing speed. |
| first_indexed | 2024-04-10T03:15:49Z |
| format | Article |
| id | doaj.art-b59b4f30a512494ea8d84f469124c9d2 |
| institution | Directory Open Access Journal |
| issn | 1729-7648 |
| language | Russian |
| last_indexed | 2025-03-14T05:52:31Z |
| publishDate | 2019-06-01 |
| publisher | Educational institution «Belarusian State University of Informatics and Radioelectronics» |
| record_format | Article |
| series | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| spelling | doaj.art-b59b4f30a512494ea8d84f469124c9d22025-03-05T12:43:01ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482019-06-01069297228CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATEI. N. Gubchik0Белорусский государственный университет информатики и радиоэлектроникиThe article describes the calibration method of the photometric system for a particular purpose of estimation position of the conductor connecting the semiconductor chip and the substrate. A nonlinear model of the camera lens distortion, which allows estimating the position of the conductor in a three-dimensional space with the required accuracy is described. The novelty of the described technique is to provide the required accuracy of conductor parameters measurement with a high processing speed.https://doklady.bsuir.by/jour/article/view/229калибровка камерыточность калибровкитрехмерная сцена |
| spellingShingle | I. N. Gubchik CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki калибровка камеры точность калибровки трехмерная сцена |
| title | CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE |
| title_full | CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE |
| title_fullStr | CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE |
| title_full_unstemmed | CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE |
| title_short | CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE |
| title_sort | calibration of the system used for conductor inspection at microchip substrate |
| topic | калибровка камеры точность калибровки трехмерная сцена |
| url | https://doklady.bsuir.by/jour/article/view/229 |
| work_keys_str_mv | AT ingubchik calibrationofthesystemusedforconductorinspectionatmicrochipsubstrate |