CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE

CALIBRATION OF THE SYSTEM USED FOR CONDUCTOR INSPECTION AT MICROCHIP SUBSTRATE

The article describes the calibration method of the photometric system for a particular purpose of estimation position of the conductor connecting the semiconductor chip and the substrate. A nonlinear model of the camera lens distortion, which allows estimating the position of the conductor in a thr...

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Bibliographic Details
Main Author: I. N. Gubchik
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
калибровка камеры
точность калибровки
трехмерная сцена
Online Access:https://doklady.bsuir.by/jour/article/view/229

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