Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification
Radio tomographic imaging (RTI) is a technique for estimating spatial loss fields (SLFs), which maps the quantified attenuation of radio signals at every spatial location within monitored regions. In this study, we investigate RTI techniques in indoor factory environments, where the RTI techniques d...
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IEEE
2023-01-01
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Series: | IEEE Access |
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Online Access: | https://ieeexplore.ieee.org/document/10058967/ |
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author | Takahiro Matsuda Yoshiaki Nishikawa Eiji Takahashi Takeo Onishi Toshiki Takeuchi |
author_facet | Takahiro Matsuda Yoshiaki Nishikawa Eiji Takahashi Takeo Onishi Toshiki Takeuchi |
author_sort | Takahiro Matsuda |
collection | DOAJ |
description | Radio tomographic imaging (RTI) is a technique for estimating spatial loss fields (SLFs), which maps the quantified attenuation of radio signals at every spatial location within monitored regions. In this study, we investigate RTI techniques in indoor factory environments, where the RTI techniques deteriorate because of severe multipath channels. We propose the binary radio tomographic imaging (binary RTI) method, where the attenuation level of each pixel in a SLF is defined as a binary value. The binary RTI method is suited for factory environments, including metallic objects, because radio signals are almost fully reflected rather than getting absorbed by such objects. In the proposed method, we suppose that transmitted signals are modulated with an orthogonal frequency division multiplexing (OFDM) format, and each receiver is equipped with multiple antenna elements. By adopting the two-dimensional multiple signal classification (MUSIC), the proposed method identifies whether the signals are transmitted in a line-of-sight (LOS) or a non-line-of-sight (NLOS) path. From the LOS/NLOS identification, we propose two algorithms to estimate the binary SLF: a simple greedy algorithm and a relaxation algorithm with low-rank approximation. We evaluate the performance of the proposed method via simulation experiments. To assess the applicability of the proposed method to factory environments, we assume a severe multipath environment where all the objects, wall, and ceiling are perfect electrical conductors, and show that by using an appropriate threshold parameter for the LOS/NLOS identification, the proposed method can estimate the binary SLF in the test environment. |
first_indexed | 2024-04-10T04:36:45Z |
format | Article |
id | doaj.art-b6390e31bdda450097fb36cedb44b17d |
institution | Directory Open Access Journal |
issn | 2169-3536 |
language | English |
last_indexed | 2024-04-10T04:36:45Z |
publishDate | 2023-01-01 |
publisher | IEEE |
record_format | Article |
series | IEEE Access |
spelling | doaj.art-b6390e31bdda450097fb36cedb44b17d2023-03-10T00:00:32ZengIEEEIEEE Access2169-35362023-01-0111224182242910.1109/ACCESS.2023.325256810058967Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS IdentificationTakahiro Matsuda0https://orcid.org/0000-0002-9728-9968Yoshiaki Nishikawa1Eiji Takahashi2https://orcid.org/0000-0003-3402-2024Takeo Onishi3Toshiki Takeuchi4Graduate School of Systems Design, Tokyo Metropolitan University, Tokyo, JapanGraduate School of Systems Design, Tokyo Metropolitan University, Tokyo, JapanSecure Systems Platforms Research Laboratories, NEC Corporation, Kawasaki, Kanagawa, JapanSecure Systems Platforms Research Laboratories, NEC Corporation, Kawasaki, Kanagawa, JapanAdvanced Network Research Laboratories, NEC Corporation, Kawasaki, Kanagawa, JapanRadio tomographic imaging (RTI) is a technique for estimating spatial loss fields (SLFs), which maps the quantified attenuation of radio signals at every spatial location within monitored regions. In this study, we investigate RTI techniques in indoor factory environments, where the RTI techniques deteriorate because of severe multipath channels. We propose the binary radio tomographic imaging (binary RTI) method, where the attenuation level of each pixel in a SLF is defined as a binary value. The binary RTI method is suited for factory environments, including metallic objects, because radio signals are almost fully reflected rather than getting absorbed by such objects. In the proposed method, we suppose that transmitted signals are modulated with an orthogonal frequency division multiplexing (OFDM) format, and each receiver is equipped with multiple antenna elements. By adopting the two-dimensional multiple signal classification (MUSIC), the proposed method identifies whether the signals are transmitted in a line-of-sight (LOS) or a non-line-of-sight (NLOS) path. From the LOS/NLOS identification, we propose two algorithms to estimate the binary SLF: a simple greedy algorithm and a relaxation algorithm with low-rank approximation. We evaluate the performance of the proposed method via simulation experiments. To assess the applicability of the proposed method to factory environments, we assume a severe multipath environment where all the objects, wall, and ceiling are perfect electrical conductors, and show that by using an appropriate threshold parameter for the LOS/NLOS identification, the proposed method can estimate the binary SLF in the test environment.https://ieeexplore.ieee.org/document/10058967/Factory environmentLOS/NLOS identificationradio tomographic imaging |
spellingShingle | Takahiro Matsuda Yoshiaki Nishikawa Eiji Takahashi Takeo Onishi Toshiki Takeuchi Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification IEEE Access Factory environment LOS/NLOS identification radio tomographic imaging |
title | Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification |
title_full | Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification |
title_fullStr | Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification |
title_full_unstemmed | Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification |
title_short | Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification |
title_sort | binary radio tomographic imaging in factory environments based on los nlos identification |
topic | Factory environment LOS/NLOS identification radio tomographic imaging |
url | https://ieeexplore.ieee.org/document/10058967/ |
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