A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction

Images produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and image-processing or machine-vision algorithms. This pa...

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Main Authors: Bárbaro M. López-Portilla, Wladimir Valenzuela, Payman Zarkesh-Ha, Miguel Figueroa
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/2/934
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author Bárbaro M. López-Portilla
Wladimir Valenzuela
Payman Zarkesh-Ha
Miguel Figueroa
author_facet Bárbaro M. López-Portilla
Wladimir Valenzuela
Payman Zarkesh-Ha
Miguel Figueroa
author_sort Bárbaro M. López-Portilla
collection DOAJ
description Images produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and image-processing or machine-vision algorithms. This paper proposes a defective pixel detection and correction algorithm and its implementation using CMOS analog circuits, which are integrated with the image sensor at the pixel and column levels. During photocurrent integration, the circuit detects defective values in parallel at each pixel using simple arithmetic operations within a neighborhood. At the image-column level, the circuit replaces the defective pixels with the median value of their neighborhood. To validate our approach, we designed a <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>128</mn><mo>×</mo><mn>128</mn></mrow></semantics></math></inline-formula>-pixel imager in a <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>0.35</mn><mspace width="3.33333pt"></mspace><mi mathvariant="sans-serif">μ</mi></mrow></semantics></math></inline-formula>m CMOS process, which integrates our defective-pixel detection/correction circuits and processes images at 694 frames per second, according to post-layout simulations. Operating at that frame rate, our proposed algorithm and its CMOS implementation produce better results than current state-of-the-art algorithms: it achieves a Peak Signal to Noise Ratio (PSNR) and Image Enhancement Factor (IEF) of 45 dB and 198.4, respectively, in images with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>0.5</mn><mo>%</mo></mrow></semantics></math></inline-formula> random defective pixels, and a PSNR of 44.4 dB and IEF of 194.2, respectively, in images with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>1.0</mn><mo>%</mo></mrow></semantics></math></inline-formula> random defective pixels.
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spelling doaj.art-b661e396e8684644b2606894b5cdc1952023-12-01T00:30:02ZengMDPI AGSensors1424-82202023-01-0123293410.3390/s23020934A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and CorrectionBárbaro M. López-Portilla0Wladimir Valenzuela1Payman Zarkesh-Ha2Miguel Figueroa3Electrical Engineering Department, University of Concepción, Edmundo Larenas 219, Concepción 4070386, ChileElectrical Engineering Department, University of Concepción, Edmundo Larenas 219, Concepción 4070386, ChileDepartment of Electrical and Computer Engineering (ECE), University of New Mexico, Albuquerque, NM 87131-1070, USAElectrical Engineering Department, University of Concepción, Edmundo Larenas 219, Concepción 4070386, ChileImages produced by CMOS sensors may contain defective pixels due to noise, manufacturing errors, or device malfunction, which must be detected and corrected at early processing stages in order to produce images that are useful to human users and image-processing or machine-vision algorithms. This paper proposes a defective pixel detection and correction algorithm and its implementation using CMOS analog circuits, which are integrated with the image sensor at the pixel and column levels. During photocurrent integration, the circuit detects defective values in parallel at each pixel using simple arithmetic operations within a neighborhood. At the image-column level, the circuit replaces the defective pixels with the median value of their neighborhood. To validate our approach, we designed a <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>128</mn><mo>×</mo><mn>128</mn></mrow></semantics></math></inline-formula>-pixel imager in a <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>0.35</mn><mspace width="3.33333pt"></mspace><mi mathvariant="sans-serif">μ</mi></mrow></semantics></math></inline-formula>m CMOS process, which integrates our defective-pixel detection/correction circuits and processes images at 694 frames per second, according to post-layout simulations. Operating at that frame rate, our proposed algorithm and its CMOS implementation produce better results than current state-of-the-art algorithms: it achieves a Peak Signal to Noise Ratio (PSNR) and Image Enhancement Factor (IEF) of 45 dB and 198.4, respectively, in images with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>0.5</mn><mo>%</mo></mrow></semantics></math></inline-formula> random defective pixels, and a PSNR of 44.4 dB and IEF of 194.2, respectively, in images with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>1.0</mn><mo>%</mo></mrow></semantics></math></inline-formula> random defective pixels.https://www.mdpi.com/1424-8220/23/2/934defective pixeldetection and correction algorithmsimage sensorintegrated circuitintelligent readout circuit
spellingShingle Bárbaro M. López-Portilla
Wladimir Valenzuela
Payman Zarkesh-Ha
Miguel Figueroa
A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
Sensors
defective pixel
detection and correction algorithms
image sensor
integrated circuit
intelligent readout circuit
title A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
title_full A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
title_fullStr A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
title_full_unstemmed A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
title_short A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction
title_sort cmos image readout circuit with on chip defective pixel detection and correction
topic defective pixel
detection and correction algorithms
image sensor
integrated circuit
intelligent readout circuit
url https://www.mdpi.com/1424-8220/23/2/934
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