Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization
Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin films were prepared by solid-state sulfurizing Cu-Zn-Sn(CZT) metallic precursors. The effect of sulfurization time on phases, chemical composition, surface morphology and optical properties was investigated by X-ray diffraction (XRD...
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| Format: | Article |
| Language: | zho |
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Journal of Materials Engineering
2016-09-01
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| Series: | Cailiao gongcheng |
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| Online Access: | http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2016.09.010 |
| _version_ | 1828074879738445824 |
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| author | CAO Zhong-ming YANG Yuan-zheng XU Jia-xiong XIE Zhi-wei |
| author_facet | CAO Zhong-ming YANG Yuan-zheng XU Jia-xiong XIE Zhi-wei |
| author_sort | CAO Zhong-ming |
| collection | DOAJ |
| description | Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin films were prepared by solid-state sulfurizing Cu-Zn-Sn(CZT) metallic precursors. The effect of sulfurization time on phases, chemical composition, surface morphology and optical properties was investigated by X-ray diffraction (XRD), Raman spectrum, energy dispersive of X-ray (EDS), scanning electron microscope (SEM) and UV-Vis, respectively. The results show that with the sulfurization time and content of Cu increase, Zn particularly decreases. The films that sulfurized over 40min occur with impurities like SnS, Sn<sub>2</sub>S<sub>3</sub> and Cu<sub>2</sub>SnS<sub>3</sub>, which lead smaller optical band gap. When the sulfurization time is 20min, the sample is single phase CZTS thin film, which surface is uniform and even, Cu-poor and Sn-rich. The absorption coefficient is over 10<sup>4</sup>cm<sup>-1</sup>. The band gap energy is estimated 1.56eV. |
| first_indexed | 2024-04-11T01:51:16Z |
| format | Article |
| id | doaj.art-b6718e7b3d7948d0adc2eea071dbe3e8 |
| institution | Directory Open Access Journal |
| issn | 1001-4381 1001-4381 |
| language | zho |
| last_indexed | 2024-04-11T01:51:16Z |
| publishDate | 2016-09-01 |
| publisher | Journal of Materials Engineering |
| record_format | Article |
| series | Cailiao gongcheng |
| spelling | doaj.art-b6718e7b3d7948d0adc2eea071dbe3e82023-01-03T06:26:53ZzhoJournal of Materials EngineeringCailiao gongcheng1001-43811001-43812016-09-01449636710.11868/j.issn.1001-4381.2016.09.01020160910Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state SulfurizationCAO Zhong-ming0YANG Yuan-zheng1XU Jia-xiong2XIE Zhi-wei3School of Materials and Energy, Guangdong University of Technology, Guangzhou 510006, ChinaSchool of Materials and Energy, Guangdong University of Technology, Guangzhou 510006, ChinaSchool of Materials and Energy, Guangdong University of Technology, Guangzhou 510006, ChinaSchool of Materials and Energy, Guangdong University of Technology, Guangzhou 510006, ChinaCu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) thin films were prepared by solid-state sulfurizing Cu-Zn-Sn(CZT) metallic precursors. The effect of sulfurization time on phases, chemical composition, surface morphology and optical properties was investigated by X-ray diffraction (XRD), Raman spectrum, energy dispersive of X-ray (EDS), scanning electron microscope (SEM) and UV-Vis, respectively. The results show that with the sulfurization time and content of Cu increase, Zn particularly decreases. The films that sulfurized over 40min occur with impurities like SnS, Sn<sub>2</sub>S<sub>3</sub> and Cu<sub>2</sub>SnS<sub>3</sub>, which lead smaller optical band gap. When the sulfurization time is 20min, the sample is single phase CZTS thin film, which surface is uniform and even, Cu-poor and Sn-rich. The absorption coefficient is over 10<sup>4</sup>cm<sup>-1</sup>. The band gap energy is estimated 1.56eV.http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2016.09.010magnetron sputteringCZTS thin filmsolid-state sulfurizationsulfurization time |
| spellingShingle | CAO Zhong-ming YANG Yuan-zheng XU Jia-xiong XIE Zhi-wei Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization Cailiao gongcheng magnetron sputtering CZTS thin film solid-state sulfurization sulfurization time |
| title | Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization |
| title_full | Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization |
| title_fullStr | Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization |
| title_full_unstemmed | Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization |
| title_short | Effect of Sulfurization Time on Properties of CZTS Thin Films by Solid-state Sulfurization |
| title_sort | effect of sulfurization time on properties of czts thin films by solid state sulfurization |
| topic | magnetron sputtering CZTS thin film solid-state sulfurization sulfurization time |
| url | http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2016.09.010 |
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