Epitaxial Growth and Structural Characterizations of MnBi<sub>2</sub>Te<sub>4</sub> Thin Films in Nanoscale

Epitaxial Growth and Structural Characterizations of MnBi<sub>2</sub>Te<sub>4</sub> Thin Films in Nanoscale

The intrinsic magnetic topological insulator MnBi<sub>2</sub>Te<sub>4</sub> has attracted much attention due to its special magnetic and topological properties. To date, most reports have focused on bulk or flake samples. For material integration and device applications, the...

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Bibliografski detalji
Glavni autori: Shu-Hsuan Su, Jen-Te Chang, Pei-Yu Chuang, Ming-Chieh Tsai, Yu-Wei Peng, Min Kai Lee, Cheng-Maw Cheng, Jung-Chung Andrew Huang
Format: Članak
Jezik:English
Izdano: MDPI AG 2021-12-01
Serija:Nanomaterials
Teme:
MnBi<sub>2</sub>Te<sub>4</sub>
topological insulators
antiferromagnetic order
molecular beam epitaxy
Online pristup:https://www.mdpi.com/2079-4991/11/12/3322

Internet

https://www.mdpi.com/2079-4991/11/12/3322

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