A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping

A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping

In this paper, the study of defects in InAs/GaSb type-II superlattices using high-resolution an x-ray diffraction method as well as scanning (SEM) and transmission (TEM) electron microscopy is presented. The investigated superlattices had 200 (#SL200), 300 (#SL300), and 400 (#SL400) periods and were...

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Bibliographic Details
Main Authors: Iwona Sankowska, Agata Jasik, Krzysztof Czuba, Jacek Ratajczak, Paweł Kozłowski, Marek Wzorek
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Materials
Subjects:
diffuse scattering
reciprocal space mapping
InAs/GaSb type-II superlattice
Online Access:https://www.mdpi.com/1996-1944/14/17/4940

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