Multipolar second-harmonic emission with focused Gaussian beams
We show that electric-dipole-allowed surface second-harmonic (SH) generation with focused Gaussian beams can be described in terms of Mie-type multipolar contributions to the SH signal. In contrast to the traditional case, where Mie multipoles arise from field retardation across nanoparticles, the m...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2012-01-01
|
| Series: | New Journal of Physics |
| Online Access: | https://doi.org/10.1088/1367-2630/14/11/113005 |
| _version_ | 1797751670420013056 |
|---|---|
| author | Mikko J Huttunen Jouni Mäkitalo Godofredo Bautista Martti Kauranen |
| author_facet | Mikko J Huttunen Jouni Mäkitalo Godofredo Bautista Martti Kauranen |
| author_sort | Mikko J Huttunen |
| collection | DOAJ |
| description | We show that electric-dipole-allowed surface second-harmonic (SH) generation with focused Gaussian beams can be described in terms of Mie-type multipolar contributions to the SH signal. In contrast to the traditional case, where Mie multipoles arise from field retardation across nanoparticles, the multipoles here arise from the confined source volume and the tensorial properties of the SH response. We demonstrate this by measuring strongly asymmetric SH emission into reflected and transmitted directions from a nonlinear thin film with isotropic surface symmetry, where symmetric emission is expected using traditional formalisms based on plane-wave excitation. The proposed multipole approach provides a convenient way to explain the measured asymmetric emission. Our results suggest that the separation of surface and bulk responses, which have dipolar and higher-multipolar character, respectively, may be even more difficult than thought. On the other hand, the multipolar approach may allow tailoring of focal conditions in order to design confined and thin nonlinear sources with desired radiation patterns. |
| first_indexed | 2024-03-12T16:51:55Z |
| format | Article |
| id | doaj.art-b9b0f8659b104998997488d869152e47 |
| institution | Directory Open Access Journal |
| issn | 1367-2630 |
| language | English |
| last_indexed | 2024-03-12T16:51:55Z |
| publishDate | 2012-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj.art-b9b0f8659b104998997488d869152e472023-08-08T11:07:39ZengIOP PublishingNew Journal of Physics1367-26302012-01-01141111300510.1088/1367-2630/14/11/113005Multipolar second-harmonic emission with focused Gaussian beamsMikko J Huttunen0Jouni Mäkitalo1Godofredo Bautista2Martti Kauranen3Department of Physics, Tampere University of Technology , FI-33101 Tampere, FinlandDepartment of Physics, Tampere University of Technology , FI-33101 Tampere, FinlandDepartment of Physics, Tampere University of Technology , FI-33101 Tampere, FinlandDepartment of Physics, Tampere University of Technology , FI-33101 Tampere, FinlandWe show that electric-dipole-allowed surface second-harmonic (SH) generation with focused Gaussian beams can be described in terms of Mie-type multipolar contributions to the SH signal. In contrast to the traditional case, where Mie multipoles arise from field retardation across nanoparticles, the multipoles here arise from the confined source volume and the tensorial properties of the SH response. We demonstrate this by measuring strongly asymmetric SH emission into reflected and transmitted directions from a nonlinear thin film with isotropic surface symmetry, where symmetric emission is expected using traditional formalisms based on plane-wave excitation. The proposed multipole approach provides a convenient way to explain the measured asymmetric emission. Our results suggest that the separation of surface and bulk responses, which have dipolar and higher-multipolar character, respectively, may be even more difficult than thought. On the other hand, the multipolar approach may allow tailoring of focal conditions in order to design confined and thin nonlinear sources with desired radiation patterns.https://doi.org/10.1088/1367-2630/14/11/113005 |
| spellingShingle | Mikko J Huttunen Jouni Mäkitalo Godofredo Bautista Martti Kauranen Multipolar second-harmonic emission with focused Gaussian beams New Journal of Physics |
| title | Multipolar second-harmonic emission with focused Gaussian beams |
| title_full | Multipolar second-harmonic emission with focused Gaussian beams |
| title_fullStr | Multipolar second-harmonic emission with focused Gaussian beams |
| title_full_unstemmed | Multipolar second-harmonic emission with focused Gaussian beams |
| title_short | Multipolar second-harmonic emission with focused Gaussian beams |
| title_sort | multipolar second harmonic emission with focused gaussian beams |
| url | https://doi.org/10.1088/1367-2630/14/11/113005 |
| work_keys_str_mv | AT mikkojhuttunen multipolarsecondharmonicemissionwithfocusedgaussianbeams AT jounimakitalo multipolarsecondharmonicemissionwithfocusedgaussianbeams AT godofredobautista multipolarsecondharmonicemissionwithfocusedgaussianbeams AT marttikauranen multipolarsecondharmonicemissionwithfocusedgaussianbeams |