Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons
Abstract Muon spin rotation with low‐energy muons (LE‐µSR) is a powerful nuclear method where electrical and magnetic properties of surface‐near regions and thin films can be studied on a length scale of ≈200 nm. This study shows the potential of utilizing low‐energy muons for a depth‐resolved chara...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-07-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202300209 |