Dual-comb-based multi-axis time-of-flight measurement via high-efficiency optical cross-correlation in a semiconductor optical amplifier
Absolute distance measurement for multiple targets is required in industrial and scientific fields such as machine monitoring, detection of distortion in large structures, wafer alignment in semiconductor manufacturing, and the formation flying of satellites. Furthermore, the expansion of measuremen...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2023-11-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0165560 |