Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry
Material characterization in the 0.1 - 10 THz range has been a major topic of research since its first demonstration 30 years ago. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power and signal-to-noise ratio. However, material chara...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9216119/ |